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Xing Chen Phones & Addresses

  • 1590 Broadway APT 207N, San Francisco, CA 94109 (415) 776-7086

Professional Records

Medicine Doctors

Xing Chen Photo 1

Xing Lian Chen

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Description:
Ms. Chen works in Brooklyn, NY and 1 other location and specializes in Family Medicine. Ms. Chen is affiliated with New York Methodist Hospital.

Resumes

Resumes

Xing Chen Photo 2

Xing Chen Astoria, NY

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Work:
JETBLUE AIRWAYS

2011 to 2000
Senior Analyst Schedule Planning

FEDERAL AVIATION ADMINSTRATION (FAA)
Washington, DC
2006 to 2011
Operation Research Analyst

NATIONAL CENTER OF EXCELLENCE FOR AVIATION OPERATIONS RESEARCH (NEXTOR)
Berkeley, CA
2005 to 2006
Graduate Research Assistant

Education:
NEW YORK UNIVERSITY
New York, NY
Jan 2015
Master of Business Administration in Specializations

UNIVERSITY OF CALIFORNIA, BERKELEY
Berkeley, CA
Jun 2014

UC Berkeley
2001

Business Records

Name / Title
Company / Classification
Phones & Addresses
Xing Zhou Chen
HONG KONG BUFFET 5858 LLC
Xing Chen
PHO BC, INC
Xing Chen
Managing
Kisha Studio, LLC
Retail
291 3 Ave, San Francisco, CA 94118

Publications

Isbn (Books And Publications)

Shuo Bu Jin De Li Shutong

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Author

Xing Chen

ISBN #

7101047750

Us Patents

System For Non-Destructive Measurement Of Samples

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US Patent:
62689169, Jul 31, 2001
Filed:
May 11, 1999
Appl. No.:
9/310017
Inventors:
Shing Lee - Fremont CA
Mehrdad Nikoonahad - Menlo Park CA
Xing Chen - San Jose CA
Assignee:
Kla-Tencor Corporation - San Jose CA
International Classification:
G01J 400
G01N 2100
US Classification:
356369
Abstract:
The surface of a doped semiconductor wafer is heated locally by means of a pump beam whose intensity is modulated at a first frequency. The heated area is sampled by a probe beam whose intensity is modulated at a second frequency. After the probe beam has been modulated (reflected or transmitted) at the first frequency by the wafer, the modulated probe beam is detected at a frequency equal to the difference between the harmonics of the first and second frequencies to determine dose of the dopants in the wafer. Such or similar type of instrument for measuring dose may be combined with an ellipsometer, reflectometer or polarimeter for measuring dose as well as thickness(es) and/or indices of refraction in a combined instrument for measuring the same sample.

Use Of Pulsed-Dc Wafer Bias For Filling Vias/Trenches With Metal In Hdp Physical Vapor Deposition

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US Patent:
60511141, Apr 18, 2000
Filed:
Jun 23, 1997
Appl. No.:
8/880467
Inventors:
Zheng Xu - Foster City CA
Kenny King-tai Ngan - Fremont CA
Xing Chen - Cambridge MA
John Urbahn - Hampstead NH
Lawrence P. Bourget - Reading MA
Assignee:
Applied Materials, Inc. - Santa Clara CA
International Classification:
C23C 1434
US Classification:
2041923
Abstract:
The present invention provides a method and apparatus for preferential PVD conductor fill in an integrated circuit structure. The present invention utilizes a high density plasma for sputter deposition of a conductive layer on a patterned substrate, and a pulsed DC power source capacitively coupled to the substrate to generate an ion current at the surface of the substrate. The ion current prevents sticking of the deposited material to the field areas of the patterned substrate, or etches deposited material from the field areas to eliminate crowning or cusping problems associated with deposition of a conductive material in a trench, hole or via formed on the substrate.

Systems And Methods For Histogram-Based Weighted Prediction In Video Encoding

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US Patent:
20220303525, Sep 22, 2022
Filed:
Dec 21, 2021
Appl. No.:
17/558276
Inventors:
- Menlo Park CA, US
Guogang Hua - San Ramon CA, US
Harikrishna Madadi Reddy - San Jose CA, US
Chung-Fu Lin - Campbell CA, US
Xing Cindy Chen - Los Altos CA, US
Sujith Srinivasan - Fremont CA, US
International Classification:
H04N 19/105
H04N 19/196
H04N 19/51
H04N 19/172
Abstract:
A disclosed computer-implemented method may include (1) selecting, from a video stream, a reference frame and a current frame, (2) collecting a reference histogram of the reference frame and a current histogram of the current frame, and (3) generating a smoothed reference histogram by applying a smoothing function to at least a portion of the reference histogram. In some examples, the computer-implemented method may also include (1) determining a similarity metric between the smoothed reference histogram and the current histogram and, (2) when the similarity metric is greater than a threshold value, applying weighted prediction during a motion estimation portion of an encoding of the video stream. Various other methods, systems, and computer-readable media are also disclosed.

Electrical Power Grid Interconnections

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US Patent:
20210406425, Dec 30, 2021
Filed:
Jun 22, 2021
Appl. No.:
17/354012
Inventors:
- Mountain View CA, US
Xinyue Li - San Mateo CA, US
Page Furey Crahan - San Francisco CA, US
Raymond Daly - Palo Alto CA, US
Peter Evans - Los Altos Hills CA, US
Xing Chen - Sunnyvale CA, US
Amanda McNary - Redwood City CA, US
International Classification:
G06F 30/20
H02J 13/00
H02J 3/00
G06T 11/20
G06T 11/00
Abstract:
A computer-implemented method executed by one or more processors includes receiving interconnection data for a proposed interconnection to a power grid; accessing a power grid model including a topological representation of the power grid, electrical specifications of grid components, and empirical operation characteristics; and generating, using the interconnection data for the proposed interconnection to the power grid, and the power grid model, simulated power grid data. The simulated power grid data is based on simulating operation of the power grid with the proposed interconnection coupled to a location of the power grid identified by the interconnection data during a simulated time period. The simulated power grid data includes a plurality of different temporal and spatially dependent characteristics of the power grid. The method includes evaluating, using one or more metrics, the simulated power grid data; and outputting evaluation results of the one or more metrics.

Facilitating Quality Of Service Flow Remapping Utilizing A Service Data Adaptation Protocol Layer

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US Patent:
20190320362, Oct 17, 2019
Filed:
Apr 10, 2019
Appl. No.:
16/380924
Inventors:
- San Diego CA, US
Yu-Ting YU - San Francisco CA, US
Srinivas Reddy MUDIREDDY - San Diego CA, US
Tom CHIN - San Diego CA, US
Suli ZHAO - San Diego CA, US
Aziz GHOLMIEH - Del Mar CA, US
Xing CHEN - San Diego CA, US
Ozcan OZTURK - San Diego CA, US
Arnaud MEYLAN - San Diego CA, US
International Classification:
H04W 36/06
Abstract:
Aspects directed towards Quality of Service (QoS) flow remapping are disclosed. In an example, upon detecting a mapping reconfiguration of a first QoS flow from a first data radio bearer (DRB) to another DRB, a Service Data Adaptation Protocol (SDAP) control protocol data unit (PDU) is generated indicating that a final SDAP data PDU associated with the first QoS flow has been transmitted on the first DRB. The SDAP control PDU is then transmitted via the first DRB. In another example, upon detecting a mapping reconfiguration of a first QoS flow from a first DRB to another DRB, an end marker parameter is set in an SDAP header of a first SDAP data PDU received from an upper layer after the mapping reconfiguration indicating that the first SDAP data PDU is a final SDAP data PDU associated with the first QoS flow transmitted on the first DRB.

Configurable Commit In A Content Management System

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US Patent:
20180011896, Jan 11, 2018
Filed:
Jul 8, 2016
Appl. No.:
15/205586
Inventors:
- Pleasanton CA, US
Xing Chen - San Ramon CA, US
Gary Lee - San Ramon CA, US
Assignee:
Veeva Systems Inc. - Pleasanton CA
International Classification:
G06F 17/30
Abstract:
Systems and methods for controlling commits to a search platform in a content management system. Identification information of endpoints may be passed down from endpoints to the search platform. Endpoints may be grouped based on their identification information, and commit policies may be assigned to each group of endpoints. A commit request from an endpoint to the search platform may be intercepted, its group may be determined based on the endpoint identification information, and commit policy for that group may be applied to the commit request.
Xing Z Chen from San Francisco, CA, age ~89 Get Report