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Xiaoyong Liu

from San Jose, CA
Age ~51
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Also known as:
Xiao Yong Liu, Liu Xiaoyong
Phone and address:
5230 Adalina Ct, San Jose, CA 95124
Related to:
Ling LiuLing C Liu, 56
Connected to:
Abby Liu, 37Alba Liu, 48Alina Y Liu, 53Annan R Liu, 53Antong Liu, 35Anwei Liu, 62Bai Liu, 66Bao Liu, 51Baoxian Liu, 55Bella C Liu, 101

Xiaoyong Liu Phones & Addresses

  • 5230 Adalina Ct, San Jose, CA 95124
  • 8413 Victory Ln, Potomac, MD 20854
  • Rockville, MD
  • Greenbelt, MD
  • 8 Highpoint Cir, Quincy, MA 02169 (617) 479-4326
  • 13 Bonney Ln, Mansfield, MA 02048 (508) 337-6823
  • Providence, RI
  • 380 Brookmere Dr, San Jose, CA 95123

Work

Company: National institute of standards and technology Nov 2009 Position: Research scientist

Education

School / High School: Brown University May 2004 Specialities: Ph. D in Physics

Skills

Thin Films • Characterization • Nanotechnology • Sensors • Nanofabrication • Magnetics • Afm • Semiconductors • Physics • R&D • Matlab • Labview • Jmp • Failure Analysis • Vacuum • Experimentation • Statistics • Research and Development • Autocad • Magnetism • Vacuum Instrumention • Photomask Design/Making • Transport Measurement • Data Mining • Project Mangement

Languages

English

Ranks

Certificate: Certficate For Machine Learning

Interests

Project Management • Mram • Magnetic Recording • Mems and Bio Sensing Applications • Magnetic Sensor • Renewable Energy • Nanotechnology

Industries

Computer Hardware

Resumes

Resumes

Xiaoyong Liu Photo 1

Principal Engineer And Technologist

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Location:
5230 Adalina Ct, San Jose, CA 95124
Industry:
Computer Hardware
Work:
National Institute of Standards and Technology Nov 2009 - Aug 2012
Research Scientist
Hgst, A Western Digital Company Nov 2009 - Aug 2012
Principal Engineer and Technologist
Hgst, A Western Digital Company Jun 2007 - Nov 2009
Research Staff Member
Micro Magnetics, Inc. Jun 2004 - May 2007
Project Manager, Sensor Product
Brown University Jan 2006 - Jan 2007
Adjunct Assistant Professor
Education:
Brown University 1998 - 2004
Doctorates, Doctor of Philosophy, Physics Brown University 1999 - 2003
Master of Science, Masters Nanjing University 1995 - 1998
Nanjing University 1991 - 1995
Bachelors, Bachelor of Science, Physics
Skills:
Thin Films
Characterization
Nanotechnology
Sensors
Nanofabrication
Magnetics
Afm
Semiconductors
Physics
R&D
Matlab
Labview
Jmp
Failure Analysis
Vacuum
Experimentation
Statistics
Research and Development
Autocad
Magnetism
Vacuum Instrumention
Photomask Design/Making
Transport Measurement
Data Mining
Project Mangement
Interests:
Project Management
Mram
Magnetic Recording
Mems and Bio Sensing Applications
Magnetic Sensor
Renewable Energy
Nanotechnology
Languages:
English
Certifications:
Certficate For Machine Learning
Machine Learning Foundations: A Case Study Approach
Machine Learning: Regression
Machine Learning: Classification
Machine Learning: Clustering & Retrieval
Neural Networks and Deep Learning
Improving Deep Neural Networks: Hyperparameter Tuning, Regularization and Optimization
Structuring Machine Learning Projects
Convolutional Neural Networks
Sequence Models
Python Programming: A Concise Introduction
Applied Machine Learning In Python
Databases and Sql For Data Science By Ibm on Coursera
Machine Learning With Python (Ibm)
Advanced Machine Learning and Signal Processing
Applied Ai With Deeplearning
Convolutional Neural Networks In Tensorflow
Introduction To Tensorflow For Artificial Intelligence, Machine Learning, and Deep Learning
Natural Language Processing In Tensorflow
Xiaoyong Liu Photo 2

Xiaoyong Liu Greenbelt, MD

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Work:
National Institute of Standards and Technology

Nov 2009 to 2000
Research Scientist
Hitachi Global Storage Technologies
San Jose, CA
Jun 2007 to Oct 2009
Research Staff Member
Micro Magnetics Inc
Fall River, MA
Jun 2004 to May 2007
Project Manager of Sensor Products
NSF SBIR, NIST ATP, Navy STTR programs

Jun 2000 to May 2004
Research Assistant, Nanoscale Physics and Device Lab, Physics Department, Brown University
Physics department, Brown University

Sep 1999 to Jun 2000
Teaching Assistant
National Lab of Solid State Microstructure

Sep 1994 to May 1998
Research Assistant
Physics department, Nanjing University

Sep 1996 to Jun 1997
Student Advisor
Education:
Brown University
May 2004
Ph. D in Physics
Brown University
May 2003
Electronic Engineering
Brown University
May 2000
Physics
Nanjing University
Jun 1998
Condensed Matter Physics
Nanjing University
Jun 1995
B. S in China, Physics

Business Records

Name / Title
Company / Classification
Phones & Addresses
Xiaoyong Liu
Principal
Liu, Xiaoyong
Mfg Semiconductors/Related Devices
8150 Lakecrest Dr, Greenbelt, MD 20770
Xiaoyong Liu
Principal Investigator
MICRO MAGNETICS, INC
Develops & Mfrs Magnetic Sensors & Applications
617 Airport Rd, Fall River, MA 02720
(508) 672-4489

Publications

Us Patents

Method Of Calibrating A Wavelength-Modulation Spectroscopy Apparatus

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US Patent:
7943915, May 17, 2011
Filed:
Oct 10, 2008
Appl. No.:
12/249096
Inventors:
Xiaoyong Liu - Malden MA, US
Yufeng Huang - North Chelmsford MA, US
John McKinley Poole - Maynard MA, US
Gene Smith Berkowitz - Sudbury MA, US
Anthony Kowal - Berlin MA, US
Shawn D. Wehe - Niskayuna NY, US
Hejie Li - Schenectady NY, US
Assignee:
GE Infrastructure Sensing, Inc. - Billerica MA
International Classification:
G01V 8/00
G01J 3/28
US Classification:
2505591, 356326
Abstract:
Several methods of calibrating a wavelength-modulation spectroscopy apparatus configured to measure a concentration of an analyte in a sample gas are disclosed. Each of the methods allows for calibration and recalibration using a relatively safe gas regardless of whether the sample gas for which the concentration of the analyte can be determined is a hazardous gas. In one embodiment of the invention, calibration that is sample-gas specific is accomplished by determining a first slope coefficient and calibration function for the sample gas, after which a scaling factor can be determined based on the first slope coefficient and a second slope coefficient for the same or a different sample gas and used in a subsequent calibration (or recalibration) to scale the calibration function. In other embodiments of the invention, calibration that is not sample-gas specific is accomplished to allow for the determination of the analyte concentration in variable gas compositions and constant gas compositions.

Wavelength-Modulation Spectroscopy Method And Apparatus

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US Patent:
7957001, Jun 7, 2011
Filed:
Oct 10, 2008
Appl. No.:
12/249156
Inventors:
Xiaoyong Liu - Malden MA, US
John McKinley Poole - Maynard MA, US
Yufeng Huang - North Chelmsford MA, US
Daniel M. Stearns - Canton MA, US
Michael J. Gambuzza - Pepperell MA, US
Gene Smith Berkowitz - Sudbury MA, US
Anthony Kowal - Berlin MA, US
Hejie Li - Schenectady NY, US
Shawn D. Wehe - Niskayuna NY, US
Assignee:
GE Infrastructure Sensing, Inc. - Billerica MA
International Classification:
G01N 21/31
US Classification:
356435, 250345
Abstract:
In one embodiment of the spectroscopy method, the method comprises the steps of modulating the wavelength of a monochromatic radiation at a modulation amplitude and a modulation frequency; determining a first variable representative of an absorbance of an analyte in a sample; and demodulating by phase-sensitive detection the first variable at a harmonic of the modulation frequency to produce a harmonic spectrum of the analyte. In one embodiment of the spectroscopy apparatus, the apparatus comprises a laser diode integrated with a first photodetector configured to detect an intensity of a backward emission from the laser diode and act as a reference detector; a second photodetector configured to detect an intensity of laser radiation exiting a sample; and electronic circuitry coupled to the laser diode and the photodetectors, configured to acquire and process spectra of the sample. In another embodiment, the spectroscopy apparatus comprises a beam splitter configured to split the laser radiation into a first radiation portion and a second radiation portion and a first photodetector configured to detect the intensity of the first radiation portion.

Method Of Calibrating A Wavelength-Modulation Spectroscopy Apparatus Using A First, Second And Third Gas To Determine Temperature And Pressure Values To Calculate Concentrations Of Analytes In A Gas

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US Patent:
8026499, Sep 27, 2011
Filed:
Apr 11, 2011
Appl. No.:
13/083704
Inventors:
Xiaoyong Liu - Malden MA, US
Yufeng Huang - North Chelmsford MA, US
John McKinley Poole - Maynard MA, US
Gene Smith Berkowitz - Sudbury MA, US
Anthony Kowal - Berlin MA, US
Shawn D. Wehe - Niskayuna NY, US
Hejie Li - Schenectady NY, US
Assignee:
GE Infrastructure Sensing, Inc. - Billerica MA
International Classification:
G01V 8/00
G01J 3/28
US Classification:
2505591, 356326
Abstract:
Several methods of calibrating a wavelength-modulation spectroscopy apparatus configured to measure a concentration of an analyte in a sample gas are disclosed. Each of the methods allows for calibration and recalibration using a relatively safe gas regardless of whether the sample gas for which the concentration of the analyte can be determined is a hazardous gas. In one embodiment of the invention, calibration that is sample-gas specific is accomplished by determining a first slope coefficient and calibration function for the sample gas, after which a scaling factor can be determined based on the first slope coefficient and a second slope coefficient for the same or a different sample gas and used in a subsequent calibration (or recalibration) to scale the calibration function. In other embodiments of the invention, calibration that is not sample-gas specific is accomplished to allow for the determination of the analyte concentration in variable gas compositions and constant gas compositions.

Method Of Calibrating A Wavelength-Modulation Spectroscopy Apparatus Using A First, Second, And Third Gas To Determine Temperature Values To Calculate Concentrations Of An Analyte In A Gas

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US Patent:
8217376, Jul 10, 2012
Filed:
Apr 11, 2011
Appl. No.:
13/083697
Inventors:
Xiaoyong Liu - Malden MA, US
Yufeng Huang - North Chelmsford MA, US
John McKinley Poole - Maynard MA, US
Gene Smith Berkowitz - Sudbury MA, US
Anthony Kowal - Berlin MA, US
Shawn D. Wehe - Niskayuna NY, US
Hejie Li - Schenectady NY, US
Assignee:
GE Infrastructure Sensing, Inc. - Billerica MA
International Classification:
G01V 8/00
G01J 3/28
US Classification:
2505591, 356326
Abstract:
Several methods of calibrating a wavelength-modulation spectroscopy apparatus configured to measure a concentration of an analyte in a sample gas are disclosed. Each of the methods allows for calibration and recalibration using a relatively safe gas regardless of whether the sample gas for which the concentration of the analyte can be determined is a hazardous gas. In one embodiment of the invention, calibration that is sample-gas specific is accomplished by determining a first slope coefficient and calibration function for the sample gas, after which a scaling factor can be determined based on the first slope coefficient and a second slope coefficient for the same or a different sample gas and used in a subsequent calibration (or recalibration) to scale the calibration function. In other embodiments of the invention, calibration that is not sample-gas specific is accomplished to allow for the determination of the analyte concentration in variable gas compositions and constant gas compositions.

Method And System For Detecting Moisture In Natural Gas

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US Patent:
8547554, Oct 1, 2013
Filed:
Aug 17, 2011
Appl. No.:
13/211821
Inventors:
Xiaoyong Frank Liu - Wellesley MA, US
Yufeng Huang - Peabody MA, US
John McKinley Poole - Maynard MA, US
Gary S. Parece - Belmont MA, US
Anthony Kowal - Berlin MA, US
Assignee:
General Electric Company - Schenectady NY
International Classification:
G01N 21/59
US Classification:
356437, 356432, 356246
Abstract:
A system includes a moisture analyzer configured to detect moisture in natural gas. The moisture analyzer includes an absorption cell that encloses and conducts the natural gas. The moisture analyzer also includes a pressure control device that may reduce a pressure of the natural gas inside the absorption cell. The moisture analyzer includes a light emitting device that may transmit light through the natural gas inside the absorption cell, as well as a photodetector that may detect an intensity of the light transmitted through the natural gas and exiting the absorption cell.

Reduction Of Noise, And Optimization Of Magnetic Field Sensitivity And Electrical Properties In Magnetic Tunnel Junction Devices

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US Patent:
20030179511, Sep 25, 2003
Filed:
Mar 25, 2002
Appl. No.:
10/105831
Inventors:
Gang Xiao - Barrington RI, US
Xiaoyong Liu - Providence RI, US
International Classification:
G11B005/127
H01L021/00
US Classification:
360/324200, 438/003000
Abstract:
Magnetic tunneling junction devices (MTJ) useful for sensing and memory applications and characterized by reduced resistance, magnetic noise, increased sensitivity, and increased magnetoresistance are disclosed herein. A method for fabrication of said MTJ is also disclosed wherein a series of materials are layered upon a substrate under controlled conditions, patterned and subjected to a period of annealing for simultaneously optimizing a plurality of performance parameters.

Reduction Of Noise, And Optimization Of Magnetic Field Sensitivity And Electrical Properties In Magnetic Tunnel Junction Devices

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US Patent:
20040196681, Oct 7, 2004
Filed:
Apr 14, 2004
Appl. No.:
10/824959
Inventors:
Gang Xiao - Barrington RI, US
Xiaoyong Liu - Providence RI, US
International Classification:
G11C011/22
US Classification:
365/145000
Abstract:
Magnetic tunneling junction devices (MTJ) useful for sensing and memory applications and characterized by reduced resistance, magnetic noise, increased sensitivity, and increased magnetoresistance are disclosed herein. A method for fabrication of said MTJ is also disclosed wherein a series of materials are layered upon a substrate under controlled conditions, patterned and subjected to a period of annealing for simultaneously optimizing a plurality of performance parameters.

Low-Power Fast-Response Machine Learning Variable Image Compression

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US Patent:
20220414942, Dec 29, 2022
Filed:
Jun 29, 2021
Appl. No.:
17/362427
Inventors:
- San Jose CA, US
Rajeev Nagabhirava - Santa Clara CA, US
Kuok San Ho - Redwood City CA, US
Daniel Bai - Freemont CA, US
Xiaoyong Liu - San Jose CA, US
International Classification:
G06T 9/00
G06T 7/20
G01S 17/89
G06N 3/08
G06N 3/063
G11C 11/155
Abstract:
Computing devices, such as mobile computing devices, have access to one or more image sensors that can capture images and video with multiple subjects. Some of these subjects may vary in priority for various tasks. It may be desired to increase or decrease the compression on each subject in order to more efficiently store the image data. Low-power, fast-response machine learning logic can be configured to allow for the generation of a plurality of inference data. Inference data can be associated with the type, motion and/or priority of the subjects as desired. This inference data can be utilized along with other subject data to generate one or more variable compression regions within the image data. The image data can be subsequently processed to compress different areas of the image based on a desired application. The variably compressed image can reduce file sizes and allow for more efficient storage and processing.
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Xiaoyong Liu from San Jose, CA, age ~51 Get Report