US Patent:
20100267049, Oct 21, 2010
Inventors:
William J. RUTTER - San Francisco CA, US
George Harold Sierra - Shekou, CN
Hongjian Liu - Cupertino CA, US
Jimmy Z. Zhang - San Francisco CA, US
Zhihai Ye - San Ramon CA, US
Alexandre Izmailov - Toronto, CA
Brian David Warner - Martinez CA, US
International Classification:
G01N 33/53
C12M 1/34
Abstract:
Devices, systems, and methods for detecting the presence of one or more analytes in a sample are described. In some variations, a test strip may be used to detect and/or analyze one or more analytes in a sample. In certain variations, a test strip configured to receive a sample for detection of an analyte therein may comprise a substrate and a coating on a portion of the substrate, the coating comprising a combination of a first analyte capture agent configured to bind to a first analyte and a second analyte capture agent configured to bind to a second analyte that is different from the first analyte.