US Patent:
20080179184, Jul 31, 2008
Inventors:
Hok-Kin Choi - San Jose CA, US
Yongmei Wu - San Jose CA, US
Vani Thirumala - San Jose CA, US
International Classification:
C25B 9/00
G01N 30/84
Abstract:
Methods of chemical analysis are disclosed. In one aspect, a method may include introducing a sample into a chromatograph. The sample may include a multiple analytes having diverse sizes and chemical properties. The analytes may be present in solution with a salt. The salt may have a concentration that is higher than that of each of the analytes. The analytes and the salt may be separated with the chromatograph. The separated analytes may be introduced into an evaporative light scattering detector (ELSD). The amounts of each of the analytes in the sample may be determined with the ELSD. Other methods, including methods of analyzing plating solutions and adjusting the plating solutions based on the analysis are also disclosed, as are systems to perform such analysis and systems to adjust the concentrations of plating solutions.
