Resumes
Resumes
Wolfgang Herr Phones & Addresses
-
13410 Hialeah Dr, Beaverton, OR 97008 (503) 524-3567
-
13410 SW Hialeah Dr, Beaverton, OR 97008 (503) 380-9831
Work
Position:
Retired
Education
Degree:
Associate degree or higher
Publications
Us Patents
Adapter And Test Fixture For An Integrated Circuit Device Package
View pageUS Patent:
51666090, Nov 24, 1992
Filed:
May 24, 1990
Appl. No.:
7/530141
Inventors:
Paul A. Cole - Portland OR
Bozidar Janko - Portland OR
Richard G. Chambers - Portland OR
Wolfgang H. Herr - Beaverton OR
Douglas W. Trobough - Beaverton OR
Peter M. Compton - Beaverton OR
Bozidar Janko - Portland OR
Richard G. Chambers - Portland OR
Wolfgang H. Herr - Beaverton OR
Douglas W. Trobough - Beaverton OR
Peter M. Compton - Beaverton OR
Assignee:
Tektronix, Inc. - Wilsonville OR
International Classification:
G01R 3102
H01R 909
H01R 909
US Classification:
324158F
Abstract:
A test fixture for a high pin count surface mounted IC device has a test head assembly connected to an adapter having electrically conductive elements that couple the output of the IC device to test points on the test head assembly. The test points are coupled to conductive pads on the test head assembly via conductive runs. The test head assembly conductive pads mate with conductive pad formed in the electrically conductive elements of the adapter. The conductive elements engage leads on the IC device providing conductive paths between the IC leads an the test points on the test head assembly. The test fixture is secured to the IC device by friction forces between the periphery of the IC device and the inner surface of the adapter. The test fixture or the adapter is usable as a low profile chip carrier by inverting the fixture or adapter and as a circuit board interconnect.
Adapter And Test Fixture For An Integrated Circuit Device Package
View pageUS Patent:
52026221, Apr 13, 1993
Filed:
Jun 24, 1991
Appl. No.:
7/720072
Inventors:
Paul A. Cole - Aloha OR
Bozidar Janko - Portland OR
Richard G. Chambers - Portland OR
Wolfgang H. Herr - Beaverton OR
Douglas W. Trobough - Beaverton OR
Peter M. Compton - Beaverton OR
Bozidar Janko - Portland OR
Richard G. Chambers - Portland OR
Wolfgang H. Herr - Beaverton OR
Douglas W. Trobough - Beaverton OR
Peter M. Compton - Beaverton OR
Assignee:
Tektronix, Inc. - Wilsonville OR
International Classification:
G01R 3102
G01R 1073
G01R 1073
US Classification:
324158F
Abstract:
A test fixture for a high pin count surface mounted IC device has a test head assembly connected to an adapter having electrically conductive elements that couple the output of the IC device to test points on the test head assembly. The test points are coupled to conductive pads on the test head assembly via conductive runs. The test head assembly conductive pads mate with conductive pad formed in the electrically conductive elements of the adapter. The conductive elements engage leads on the IC device providing conductive paths between the IC leads an the test points on the test head assembly. The test fixture is secured to the IC device by friction forces between the periphery of the IC device and the inner surface of the adapter. The test fixture or the adapter is usable as a low profile chip carrier by inverting the fixture or adapter and as a circuit board interconnect.