Inventors:
Ronald Xavier Arroyo - Austin TX, US
Kenneth A. Bird - New Paltz NY, US
William A. Ciarfella - Round Rock TX, US
Bret Peter Elison - Rochester MN, US
Gary Franklin Goth - Pleasant Valley NY, US
Terrance Wayne Kueper - Rochester MN, US
Thoi Nguyen - Austin TX, US
Roger Donell Weekly - Austin TX, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G01K 17/00
US Classification:
702136, 3241581, 438 14, 702132
Abstract:
Systems and arrangements to assess the thermal performance of a thermal solution based upon the ability of a device under test (DUT) to operate in accordance with electrical performance criteria are contemplated. Embodiments may include a tester to couple with the DUT to determine an operating junction temperature. In some embodiments, the measured junction temperature may be the operating junction temperature anticipated for the DUT in a customer installation. In other embodiments, the tester may comprise logic to calculate a projected, operating junction temperature based upon the measured junction temperature and known differences between the tester and a customer installation. Upon determining the operating junction temperature for the DUT at the customer installation, the operating junction temperature is compared against a maximum junction temperature for proper operation of the DUT. Advantageously, the maximum junction temperature may be varied based upon the project objective for a line of DUTs.