Resumes
Resumes
Vishwanath Venkataraman Phones & Addresses
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Cupertino, CA
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Dublin, CA
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San Francisco, CA
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6061 Village Bend Dr, Dallas, TX 75206 (214) 363-7297
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6061 Village Bend Dr APT 1604, Dallas, TX 75206 (214) 363-7297
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Goleta, CA
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Alameda, CA
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3060 Bolero Ct, Pleasanton, CA 94588
Work
Position:
Clerical/White Collar
Education
Degree:
Associate degree or higher
Publications
Us Patents
Methods For Testing Wireless Electronic Devices Using Short Message Service
View pageUS Patent:
8588763, Nov 19, 2013
Filed:
Jan 9, 2012
Appl. No.:
13/345993
Inventors:
Vishwanath Venkataraman - Pleasanton CA, US
Assignee:
Apple Inc. - Cupertino CA
International Classification:
H04W 24/00
US Classification:
455423, 455 6711, 455 6714, 379 2704, 379 2901, 375224
Abstract:
A device under test (DUT) may be tested using a radio-frequency test station. A test station may include a test host, a test unit coupled to the test host, and a shielded enclosure. The shielded enclosure may contain a test antenna that is coupled to the test unit via a radio-frequency cable. The DUT may be placed in the shielded enclosure during testing. The DUT may not be electrically wired to the test host. The test host may direct the test unit to transmit control signals in the form of a text message using Short Message Service (SMS) so that the DUT is placed into different desired configurations during testing. The DUT may also be configured to respond by sending SMS messages back to the test unit, where the SMS messages generated by the DUT includes radio-frequency performance metrics measured using the DUT.
Simultaneous Sensitivity Testing For Multiple Devices In Radio-Frequency Test Systems
View pageUS Patent:
8600311, Dec 3, 2013
Filed:
Mar 10, 2011
Appl. No.:
13/044857
Inventors:
Justin Gregg - San Francisco CA, US
Adil Syed - Santa Clara CA, US
Vishwanath Venkataraman - San Francisco CA, US
Adil Syed - Santa Clara CA, US
Vishwanath Venkataraman - San Francisco CA, US
Assignee:
Apple Inc. - Cupertino CA
International Classification:
H04B 17/00
US Classification:
455 6712, 455 6711
Abstract:
A test station may include a test host, a signal generator, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during device characterization operations. Radio-frequency signals may be conveyed from the signal generator to the multiple DUTs using a radiated arrangement through an antenna in the test chamber. The signal generator may broadcast downlink test signals. The DUTs may synchronize with the downlink test signals and measure radio-frequency performance levels while receiving the downlink test signals. The test host may direct the signal generator to gradually lower its output power level. The DUTs may be used to determine downlink sensitivity by monitoring the measured radio-frequency performance levels as the output power level of the signal generator is lowered. Downlink sensitivity testing may be performed across any desired radio-frequency bands and channels.
Methods For Calibrating Radio-Frequency Receivers Using Code Division Multiple Access Test Equipment
View pageUS Patent:
20110237199, Sep 29, 2011
Filed:
Mar 25, 2010
Appl. No.:
12/732108
Inventors:
Vishwanath Venkataraman - San Francisco CA, US
Justin Gregg - San Francisco CA, US
Wassim El-Hassan - San Jose CA, US
Justin Gregg - San Francisco CA, US
Wassim El-Hassan - San Jose CA, US
International Classification:
H04B 17/00
US Classification:
455 6711
Abstract:
Wireless test equipment may be used to perform over-the-air testing of user equipment. The user equipment may contain an antenna and a receiver. The wireless test equipment may contain a call box that performs network-level testing by sending and receiving protocol-compliant network messages. The call box may transmit a radio-frequency test signal at a predetermined power. The antenna in the user equipment may receive the radio-frequency test signal and may provide the received radio-frequency test signal to the input of the receiver. The call box may send a network message such as a code-division-multiple-access intercode handover command to the user equipment to direct the user equipment to measure the received radio-frequency test signal power at the input of the receiver. The measured power may be transmitted to the call box as part of a pilot measurement message indicator, using an intercode handover command, or using other network messages.
Methods For Determining Optimum Power Supply Voltages For Radio-Frequency Power Amplifier Circuitry
View pageUS Patent:
20110256838, Oct 20, 2011
Filed:
Apr 15, 2010
Appl. No.:
12/761219
Inventors:
David A. Donovan - Oakland CA, US
Justin Gregg - San Francisco CA, US
Vishwanath Venkataraman - San Francisco CA, US
Justin Gregg - San Francisco CA, US
Vishwanath Venkataraman - San Francisco CA, US
International Classification:
H04B 1/04
G01R 31/40
H03G 3/20
G01R 31/40
H03G 3/20
US Classification:
4551272, 330127, 32476401
Abstract:
Electronic devices with wireless communications capabilities are provided. The electronic device may include storage and processing circuitry, power amplifier circuitry, power supply circuitry, etc. The storage and processing circuitry may direct the power amplifier circuitry to operate using a desired gain mode, in a particular radio channel, and at a given output power level. The power supply circuitry may bias the power amplifier circuitry with a power supply voltage. The performance of the power amplifier circuitry may be characterized by an adjacent channel leakage ratio (ACLR) margin. The power consumption of the power amplifier circuitry may be characterized by a current savings ratio. A cost function may be calculated by taking the product of the ACLR margin and current savings ratio. A minimum point for each cost function curve may be determined. It is desirable to bias the power amplifier circuitry with a supply voltage corresponding to the minimum point.
Simultaneous Downlink Testing For Multiple Devices In Radio-Frequency Test Systems
View pageUS Patent:
20120122406, May 17, 2012
Filed:
Jan 31, 2011
Appl. No.:
13/018348
Inventors:
Justin Gregg - San Francisco CA, US
Adil Syed - Santa Clara CA, US
Vishwanath Venkataraman - San Francisco CA, US
Adil Syed - Santa Clara CA, US
Vishwanath Venkataraman - San Francisco CA, US
International Classification:
H04W 24/00
US Classification:
455 6711
Abstract:
A test station may include a test host, a signal generator, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during production testing. Radio-frequency signals may be conveyed from the signal generator to the multiple DUTs using a conducted arrangement through a radio-frequency signal splitter circuit or using a radiated arrangement through an antenna in the test chamber. The signal generator may broadcast initialization downlink signals. The multiple DUTs may synchronize with the initialing downlink signals. The signal generator may broadcast test downlink signals at a target output power level. The multiple DUTs may receive the test downlink signals and compute a corresponding downlink transmission performance level based on the received downlink signals. A given DUT is marked as a passing DUT if the downlink performance level is satisfactory. A given DUT may be retested if the downlink performance level fails design criteria.
Methods For Mitigating Interactions Among Wireless Devices In A Wireless Test System
View pageUS Patent:
20120123723, May 17, 2012
Filed:
Feb 1, 2011
Appl. No.:
13/019250
Inventors:
Wassim El-Hassan - San Jose CA, US
Vishwanath Venkataraman - San Francisco CA, US
Justin Gregg - San Francisco CA, US
Vishwanath Venkataraman - San Francisco CA, US
Justin Gregg - San Francisco CA, US
International Classification:
G06F 19/00
US Classification:
702108
Abstract:
A test station may include a test host, a test unit, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during wireless testing. Radio-frequency signals may be conveyed between the test unit and the multiple DUTs using a conducted arrangement through a splitter-combiner circuit or using a radiated arrangement through a test antenna in the test chamber. The multiple DUTs may be synced to the test unit one DUT at a time (in series) or in parallel. The test host may direct the test unit to broadcast downlink signals at a given channel. The test host my direct a selected DUT to transmit uplink signals at the given channel or at a selected channel that is different from the given channel. The test unit may be used to perform desired measurement on the uplink signals transmitted from the selected DUT.
Non-Synchronized Radio-Frequency Testing
View pageUS Patent:
20130049786, Feb 28, 2013
Filed:
Aug 25, 2011
Appl. No.:
13/218027
Inventors:
Wassim El-Hassan - San Jose CA, US
Vishwanath Venkataraman - San Francisco CA, US
Vishwanath Venkataraman - San Francisco CA, US
International Classification:
G01R 31/00
US Classification:
32475601
Abstract:
A device under test (DUT) may be tested using a test station having a test host, a non-signaling tester, and a test cell. During testing, the DUT may be placed within the test cell, and the DUT may be coupled to the test host and the tester. In one suitable arrangement, the DUT may be loaded with a predetermined test sequence. The predetermined test sequence may configure the DUT to transmit test signals using different network access technologies without synchronizing with the tester. The tester may receive corresponding test signals and perform desired radio-frequency measurements. In another suitable arrangement, the tester may be loaded with the predetermined test sequence. The predetermined test sequence may configure the tester to generate test signals using different network access technologies without establishing a protocol-compliant data link with the DUT. The DUT may receive corresponding test signals and compute receive signal quality.
Systems And Methods For Performing Tester-Less Radio-Frequency Testing On Wireless Communications Circuitry
View pageUS Patent:
20160072594, Mar 10, 2016
Filed:
Sep 4, 2014
Appl. No.:
14/477703
Inventors:
- Cupertino CA, US
Wassim El-Hassan - Cupertino CA, US
Vishwanath Venkataraman - San Francisco CA, US
Wassim El-Hassan - Cupertino CA, US
Vishwanath Venkataraman - San Francisco CA, US
International Classification:
H04B 17/00
Abstract:
Radio-frequency performance of wireless communications circuitry on an electronic device under test (DUT) may be tested without external test equipment such as signal analyzers or signal generators. A first DUT may transmit test signals to a second DUT. External attenuator circuitry interposed between the DUTs may attenuate the test signals to desired power levels. The second DUT may characterize and/or calibrate receiver performance by generating wireless performance metric data based on the attenuated test signals. A single DUT may transmit test signals to itself via corresponding transmit and receive ports coupled together through the attenuator. The DUT may generate performance metric data based on the test signals. The DUT may include feedback receiver circuitry coupled to an output of a transmitter via a feedback, path and may characterize and/or calibrate transmit performance using test signals transmitted by the transmitter and received by the feedback receiver.