Inventors:
Robert R. Alfano - Bronx NY, US
Iosif Zeylikovich - Brooklyn NY, US
Wubao Wang - Flushing NY, US
Jamal Ali - Brooklyn NY, US
Vincent Benischek - Shrub Oak NY, US
Yury Budansky - Oakland NJ, US
Assignee:
The Research Foundation of the City of New York - New York NY
Lockheed Martin Corporation - Bethesda MD
International Classification:
G01N 21/88
Abstract:
The present invention provides systems and methods for non-destructively detecting material abnormalities beneath a coated surface, comprising a mid-infrared (MIR) illumination unit for illuminating an area of the coated surface, and an MIR 2-D imager, which includes an MIR CCD or CMOS camera, for capturing an image of a material abnormalities under the illuminated area of the coated surface. In addition, the system may further comprise a scanning unit for moving the system to a next area.