Tushar A Parikh

20010041972, Nov 15, 2001

Mar 4, 1999

09/262545

GLENN A. DEARTH - GROTON MA, US
PAUL M. WHITTEMORE - MARLBORO MA, US
GEORGE R. PLOUFFE - BRADFORD MA, US
JOHN P. PABISZ - PEABODY MA, US
SCOTT R. MEETH - MELROSE MA, US
TUSHAR A. PARIKH - NASHUA NH, US

Sun Microsystems, Inc.

G06F009/455

703/014000

A system and method for circuitry design verification testing which provides for maximized code re-use without unnecessary allocation of system resources. A circuit simulation subsystem is interfaced with a test subsystem. The test subsystem employs a system transaction class which collects convenience routines and thereby maximizes code re-use. The system transaction class contains pointers to device transaction classes which correspond to each of the functional models in the simulation subsystem, but does not require instantiation of all of the device transaction classes and associated device objects. One or more configuration transaction classes derived from the system transaction class define transactions between selected ones of the functional models within the simulation subsystem. The configuration transaction classes inherit the convenience routines of the system transaction class, but cause instantiation of the respective functional models only when needed for a transaction.