Inventors:
Stewart O. Dunlap - Folsom CA
Stephen E. Bastear - Folsom CA
Gary M. Meszaros - Roseville CA
Nasser M. Barabi - Lafayette CA
James E. Spooner - Manteca CA
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G01R 3102
US Classification:
324755, 324765, 324754, 324758
Abstract:
A test handling assembly for conjoined integrated circuit dies is disclosed. The assembly has a wafer prober system having a chuck. A panel stage is coupled to the chuck and conjoined integrated circuit dies are coupled to the panel stage. A contactor is provided to communicate with the conjoined integrated circuit dies and the wafer prober system. Other features are disclosed.