Inventors:
- Farmington CT, US
Srinivas Ravela - Belmont MA, US
Joseph A. Sylvestro - Avon CT, US
Assignee:
UNITED TECHNOLOGIES CORPORATION - Farmington CT
International Classification:
B64F 5/60
G07C 5/00
G07C 5/08
G06T 7/33
Abstract:
A system and method of detecting damage to a component may include a first sensor and a processor. The method may include the steps of receiving, by the processor, a first data for the component from a first sensor, aligning, by the processor, the first data with a reference model, determining, by the processor, a feature dissimilarity between the first data and the reference model, classifying, by the processor, the feature dissimilarity, and determining, by the processor, a probability that the feature dissimilarity indicates damage to the component.