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Srdjan Dejan Sobajic

from San Carlos, CA
Age ~50

Srdjan Sobajic Phones & Addresses

  • 508 Hillcrest Rd, San Carlos, CA 94070 (650) 654-4893
  • 1061 Whitebick Dr, San Jose, CA 95129 (408) 973-0308
  • 2411 Carlmont Dr, Belmont, CA 94002 (650) 654-4893
  • 1212 Whipple Ave, Redwood City, CA 94062 (650) 361-1806
  • Palo Alto, CA
  • San Mateo, CA
  • Stillwater, MN

Resumes

Resumes

Srdjan Sobajic Photo 1

Senior Manager, Hardware Test Engineering

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Location:
508 Hillcrest Rd, San Carlos, CA 94070
Industry:
Computer Hardware
Work:
Apple Inc. - Cupertino, CA since Aug 2009
Senior Manager, Hardware Test Engineering

DigitalPersona, Inc. - Redwood City, CA Sep 1999 - Aug 2009
Senior Manager, Hardware Engineering

Mitsubishi Electric Corporation - Amagasaki, Hyogo, Japan Sep 1996 - Sep 1999
Research Engineer
Education:
California Institute of Technology 1992 - 1996
Skills:
Embedded Systems
Debugging
Hardware
Software Engineering
Engineering Management
Product Management
Firmware
Product Development
Software Development
Consumer Electronics
Semiconductors
C
C++
Program Management
Linux
R&D
Embedded Software
Integration
Computer Hardware
Research and Development
Security
Digital Signal Processors
Product Marketing
Device Drivers
Perl
Product Lifecycle Management
Firefighting
Languages:
English
Japanese
Serbian
Srdjan Sobajic Photo 2

Hardware Engineering Manager At Apple Inc.

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Position:
Senior Manager, Hardware Test Engineering at Apple Inc.
Location:
San Francisco Bay Area
Industry:
Computer Hardware
Work:
Apple Inc. - Cupertino, CA since Aug 2009
Senior Manager, Hardware Test Engineering

DigitalPersona, Inc. - Redwood City, CA Sep 1999 - Aug 2009
Senior Manager, Hardware Engineering

Mitsubishi Electric Corporation - Amagasaki, Hyogo, Japan Sep 1996 - Sep 1999
Research Engineer
Education:
California Institute of Technology 1992 - 1996
Skills:
Engineering Management
Software Engineering
Product Management
Consumer Electronics
C
Embedded Systems
Perl
Hardware
Debugging
C++
Security
Firmware
Software Development
Digital Signal Processors
Integration
Program Management
Product Marketing
Product Lifecycle Management
Linux
Product Development
Languages:
Japanese
Serbian

Publications

Us Patents

Test Systems With Network-Based Test Station Configuration

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US Patent:
20130054170, Feb 28, 2013
Filed:
Aug 26, 2011
Appl. No.:
13/219367
Inventors:
Srdjan Sobajic - San Carlos CA, US
Travis Gregg - San Francisco CA, US
Tony Behen - Petaluma CA, US
Mahmood Sheikh - Santa Clara CA, US
International Classification:
G06F 19/00
US Classification:
702 82
Abstract:
A test system for testing a device under test (DUT) is provided. The test system may include multiple test stations that are coupled to a network server. A master test station configuration file associated with each of the test stations may be stored on the network server. Each of the test stations may intermittently obtain updated test station configuration information from the network server to synchronize testing. A test station may be configured to check whether the DUT has successfully passed testing at preceding test stations. The test station may be given permission to write its test results into storage circuitry in the DUT. If test results are satisfactory, the DUT may be tested using a subsequent test station. If test results do not satisfy design criteria, the DUT may be sent to a corresponding repair station for rework.

Test Systems With Cables That Support Multiple Communications Buses

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US Patent:
20120290246, Nov 15, 2012
Filed:
May 13, 2011
Appl. No.:
13/107416
Inventors:
Anuj Bhatnagar - Sunnyvale CA, US
James L. McPeak - Fremont CA, US
Srdjan Sobajic - San Carlos CA, US
Nelson Fong - Elk Grove CA, US
International Classification:
G06F 19/00
US Classification:
702122
Abstract:
A test system may include test stations for testing a device under test. The test stations may each include test equipment that may be connected to a device under test using a test cable. The test cable may include a status indicator to indicate when tests have been passed or have failed. A first connector at one end of the test cable may be coupled to the test equipment. A second connector at an opposing end of the test cable may be coupled to the device under test. Communications through the first connector may use a first communications protocol. Communications through a first set of contacts in the second connector may use the first communications protocol. Communications through a second set of contacts in the second connector may use a second communications protocol.
Srdjan Dejan Sobajic from San Carlos, CA, age ~50 Get Report