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Samir Boubezari

from Santa Clara, CA
Age ~60
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Also known as:
Samir Samir, Samir R, Samir I
Phone and address:
124 Gilbert Ave, Santa Clara, CA 95051
(408) 984-2842
Related to:
Razika Niboucha, 54Razika Niboucha, 54
Connected to:
Jaroslav Boublik, 65Richard A Bouc, 65Peter Boucas, 36Anthony Q Boucaud, 76Mohamed Boucetta, 31Andrew G Bouch, 63Barbi A Bouch, 43Joseph L Bouch, 62Kylynne Bouch, 31Ryan T Bouch, 37

Samir Boubezari Phones & Addresses

  • 124 Gilbert Ave, Santa Clara, CA 95051 (408) 984-2842
  • Mountain View, CA

Resumes

Resumes

Samir Boubezari Photo 1

Director Of Engineering

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Location:
Santa Clara, CA
Industry:
Telecommunications
Work:
Qualcomm
Director of Engineering
Qualcomm
Engineer, Principal and Manager
Qualcomm Jan 2014 - Dec 2016
Principal Engineer
Qualcomm May 2011 - Dec 2013
Senior Staff Engineer
Atheros Communications Aug 2005 - May 2011
Principal Member of Technical Staff
Education:
Polytechnique Montréal
Doctorates, Masters, Doctor of Philosophy, Electrical Engineering
Skills:
Soc
Verilog
Asic
Rtl Design
Ic
Eda
Debugging
Vlsi
Formal Verification
Functional Verification
Tcl
Perl
Analog
Semiconductors
Mixed Signal
Algorithms
Analog Circuit Design
Fpga
Circuit Design
Vhdl
Samir Boubezari Photo 2

Engineer

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Location:
Santa Clara, CA
Industry:
Telecommunications
Work:
Atheros Communications
Engineer
Education:
Polytechnique Montréal 1991 - 1998

Publications

Us Patents

Method For Testability Analysis And Test Point Insertion At The Rt-Level Of A Hardware Development Language (Hdl) Specification

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US Patent:
6363520, Mar 26, 2002
Filed:
Jun 16, 1998
Appl. No.:
09/098555
Inventors:
Samir Boubezari - Mountain View CA
Eduard Cerny - Montreal, CA
Bozena Kaminska - Montreal, CA
Benoit Nadeau-Dostie - Aylmer, CA
Assignee:
LogicVision, Inc. - San Jose CA
International Classification:
G06F 1750
US Classification:
716 18, 716 2, 716 4
Abstract:
A method is provided for producing a synthesizable RT-Level specification, having a testability enhancement from a starting RT-Level specification representative of a circuit to be designed, for input to a synthesis tool to generate a gate-level circuit. The method includes the steps of performing a testability analysis on a Directed Acyclic Graph by computing and propagating Testability Measures forward and backward through VHDL statements, identifying the bits of each signal and/or variable, and adding test point statements into the specification at the RT-Level to improve testability of the circuit to be designed. The computation of Controllability and Observability method is purely functional, and does not subsume the knowledge of a gate-level implementation of the circuit being analyzed.
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Samir Boubezari from Santa Clara, CA, age ~60 Get Report