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Sam Han Quoc Huynh

from San Jose, CA
Age ~50
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Also known as:
Sam Han-Quoc Huynh, Sam H Huynh, Sam Han Huynh, Sam Living Huynh, Sam Q Huynh, Han Q Huynh, Sam Han N, Sam Quoc, Sam H, Anquoc H Sam
Related to:
Thanh V Huynh, 59Phuong M Huynh, 69Myphuong HuynhCindy Huynh, 43Steven Huynh, 39Khanh V Huynh, 48Eric Wong, 75Nancy Huynh, 41Vivian L Wong, 31Chau Q Huynh, 66Thuong M HuynhPhuoc Huynh, 63Eric Wong, 64Maggie T Tang, 60Mike Huynh, 38Albert Ly, 65Hoang C Phung, 55Karen D Huynh, 48
Connected to:
Aaron L Huynh, 54Andreas L Huynh, 56Angela Huynh, 54Anhtuan T Huynh, 51Antoine Huynh, 42Avian P Huynh, 43Bill H Huynh, 61Calvin T Huynh, 83Chantal K Huynh, 36Charlie Huynh, 41

Sam Huynh Phones & Addresses

  • San Jose, CA
  • 22626 Amador St UNIT 7, Hayward, CA 94541
  • 2159 47Th Ave, San Francisco, CA 94116 (415) 665-7984
  • Houston, TX
  • PO Box 1700, Houston, TX 77251

Work

Company: Bayer health care - Berkeley, CA Jan 2013 Position: Manufacturing technician

Education

School / High School: City College of San Francisco- San Francisco, CA Sep 1992 Specialities: general education

Emails

s***[email protected]

Resumes

Resumes

Sam Huynh Photo 1

Hw Test Engineer

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Location:
San Francisco, CA
Industry:
Computer Networking
Work:
Google
Hw Test Engineer
Dualtronics Oct 2011 - Jun 2012
Consultant Hw Engineer
Diamond Systems 2010 - 2010
Consultant Hw Engineer
Nokia Apr 1999 - Jun 2009
Hw Engineer
Fujitsu 1995 - 1998
Hw Engineer
Education:
University of Illinois at Chicago 1986 - 1990
Bachelors, Bachelor of Science In Electrical Engineering, Electrical Engineering
Skills:
Testing
Pcb Design
Hardware
Product Development
Power Supplies
Sam Huynh Photo 2

Test Engineer

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Location:
San Jose, CA
Industry:
Internet
Work:
Google
Test Engineer
Sam Huynh Photo 3

Sam Huynh

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Sam Huynh Photo 4

Sam Huynh

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Location:
United States
Sam Huynh Photo 5

Sam Huynh

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Location:
United States
Sam Huynh Photo 6

Sam Huynh Hayward, CA

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Work:
Bayer Health Care
Berkeley, CA
Jan 2013 to Oct 2013
Manufacturing Technician
Codexis
Redwood City, CA
Jan 2012 to Oct 2012
Research Assistant
Baxter
Hayward, CA
Apr 2008 to Feb 2010
Manufacturing Associate II
Codexis
Redwood City, CA
Mar 2007 to Apr 2008
Pilot Plant Technician II
VaxGen
South San Francisco, CA
Feb 2006 to Jan 2007
Manufacturing Associate I
Education:
City College of San Francisco
San Francisco, CA
Sep 1992 to Jun 1996
general education

Business Records

Name / Title
Company / Classification
Phones & Addresses
Sam M. Huynh
Director
TENT RESOURCE INCORPORATED
3518 Paluxy Cir, Missouri City, TX 77459

Publications

Us Patents

Bit-Deskewing Io Method And System

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US Patent:
7688925, Mar 30, 2010
Filed:
Aug 1, 2005
Appl. No.:
11/195082
Inventors:
Edward Lee - San Jose CA, US
Arvind Bomdica - Fremont CA, US
Lin Chen - Cupertino CA, US
Claude Gauthier - Cupertino CA, US
Sam Huynh - San Bruno CA, US
John Ling - Cupertino CA, US
Jennifer Ho - Sunnyvale CA, US
Siji Menokki Kandiyil - San Jose CA, US
Gin Yee - Sunnyvale CA, US
Joseph Macri - San Francisco CA, US
Assignee:
ATI Technologies, Inc. - Markham
International Classification:
H04L 7/00
US Classification:
375355, 375354, 375316, 375219, 455 73, 713600, 713400, 713502
Abstract:
An IO method and system for bit-deskewing are described. Embodiment includes a computer system with multiple components that transfer data among them. In one embodiment, a system component receives a forward strobe signal and multiple data bit signals from a transmitting component. The receiving component includes a forward strobe clock recovery circuit configurable to align a forward strobe sampling clock so as to improve sampling accuracy. The receiving component further includes at least one data bit clock recovery circuit configurable to align a data bit sampling clock so as to improve sampling accuracy, and to receive a signal from the forward strobe clock recovery circuit that causes the data bit sampling clock to track the forward strobe sampling clock during system operation.

Dynamic Impedance Compensation Circuit And Method

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US Patent:
20060097749, May 11, 2006
Filed:
Nov 5, 2004
Appl. No.:
10/982485
Inventors:
Sagheer Ahmad - Sunnyvale CA, US
Lin Chen - Cupertino CA, US
Sam Huynh - Mountain View CA, US
Joe Macri - San Francisco CA, US
Assignee:
ATI Technologies, Inc. - Markham
International Classification:
H03K 17/16
US Classification:
326030000
Abstract:
An impedance compensation circuit generates per-group pull-up impedance information and per-group pull-down impedance information to calibrate a plurality of input/output pads and dynamically updates impedance information on a per channel basis. A group refers to a group of I/O pads having similar output drive strengths in a channel. A channel refers to all I/O pads, which collectively provide a bus interface to an external device. For example, all the I/O pads interfacing with a memory module may be grouped into a channel, and address I/O pads in a channel may be arranged into a “group.” Memory I/O pads may be grouped together into a channel since memory interface pads have input/output characteristics that may be different from those of other types of I/O pads in the chip. According to one embodiment, per-group programmable offset information provides calibration information that may be different for each group in each channel.

Methods And Apparatus For Transmitting And Receiving Data Signals

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US Patent:
20060115016, Jun 1, 2006
Filed:
Nov 12, 2004
Appl. No.:
10/987747
Inventors:
Lin Chen - Cupertino CA, US
Sam Huynh - Mountain View CA, US
Joe Macri - San Francisco CA, US
Assignee:
ATI Technologies Inc. - Markham
International Classification:
H04L 27/20
US Classification:
375295000, 345530000, 345501000
Abstract:
Methods and apparatus for transmitting and receiving data in a memory interface are disclosed. The apparatus include a programmable transceiver having a variable duty cycle control, with the transceiver having at least one of a programmable variable duty cycle receiver and a programmable variable duty cycle transmitter. The receiver and the transmitter are both responsive to variable duty cycle control data and operate to vary a duty cycle of one of incoming and outgoing data. By providing programmability to the data duty cycle, the transceiver can optimally accommodate different memory device standards.

Power Distribution For Mobile Devices

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US Patent:
20170336846, Nov 23, 2017
Filed:
Jul 5, 2016
Appl. No.:
15/202265
Inventors:
- Mountain View CA, US
Andrea Cawili Gumacal - San Francisco CA, US
Sam Huynh - San Jose CA, US
Jong Hyeop Kim - San Francisco CA, US
Adam Hicklin - Boulder Creek CA, US
Pratyus Patnaik - Los Altos CA, US
George Patrick Siu - San Francisco CA, US
Terence Kwan - Cupertino CA, US
Min Sung - Sunnyvale CA, US
International Classification:
G06F 1/28
G06F 13/42
G06F 1/26
Abstract:
Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for performing tests on mobile devices. In one aspect, a power distribution system includes a set of mobile devices and a computer that manages the execution of a test using the set of mobile devices. The computer can include one or more data communication ports. The system can also include one or more Universal Serial Bus (USB) hubs connected to the mobile devices using USB cables. Each mobile device can be connected to one of the one or more USB hubs. The system can also include one or more USB charging hubs connected between each data communication port of the computer and at least one of the one or more USB hubs. The system can also include a power supply connected between a power source and each of the one or more USB hubs.
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Sam Han Quoc Huynh from San Jose, CA, age ~50 Get Report