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Ronald A Synowicki

from Lincoln, NE
Age ~56
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Also known as:
Ronald Alan Synowicki, Ron Synowicki, Ron I
Phone and address:
5121 S Bristolwood Ln, Lincoln, NE 68516
(402) 423-7970
Related to:
Joseph J Tacheron, 32Bob SynowickiNola Mcclinton, 54Charles Salmon, 83Carrie Lucas, 48Dona M Schepers, 72
Connected to:
Ashley Synowiec, 44Richard F Synowiec, 68Stephanie Synowsky, 34Judith L Synsteby, 80David L Synstegaard, 57Laura J Synstegaard, 61Ordean A Synstelien, 87Sharon M Synstelien, 78Maxwell E Synsvoll, 51Daniel B Synwolt, 93

Ronald Synowicki Phones & Addresses

  • 5121 S Bristolwood Ln, Lincoln, NE 68516 (402) 423-7970
  • Omaha, NE
  • 5121 S Bristolwood Ln, Lincoln, NE 68516 (402) 304-6228

Work

Position: Building and Grounds Cleaning and Maintenance Occupations

Education

Degree: Associate degree or higher

Publications

Us Patents

Methodology For Improving Precision Of Data Acquired By Spectrophotometer Systems

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US Patent:
6831740, Dec 14, 2004
Filed:
Aug 9, 2001
Appl. No.:
09/862881
Inventors:
Craig M. Herzinger - Lincoln NE
Steven E. Green - Lincoln NE
Ronald A. Synowicki - Lincoln NE
Assignee:
J.A. Woollam Co. Inc. - Lincoln NE
International Classification:
G01J 342
US Classification:
356319, 356323, 356332
Abstract:
Disclosed are spectrophotometer systems and methodology for obtaining data of improved precision therefrom, including replacement of data determined to be suspect based on comparison of multiple baselines.

Methodology For Providing Good Data At All Wavelengths Over A Spectroscopic Range

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US Patent:
7151605, Dec 19, 2006
Filed:
Dec 11, 2004
Appl. No.:
11/009489
Inventors:
Craig M. Herzinger - Lincoln NE, US
Steven E. Green - Lincoln NE, US
Ronald A. Synowicki - Lincoln NE, US
James D. Welch - Omaha NE, US
Assignee:
J.A. Woollam Co., Inc - Lincoln NE
International Classification:
G01J 4/00
US Classification:
356369
Abstract:
Disclosed is methodology for obtaining data of improved precision, including detection and replacement of data determined to be suspect to provide good data over a spectroscopic range of wavelengths.

Method Of Determining Bulk Refractive Indicies Of Liquids From Thin Films Thereof

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US Patent:
7187443, Mar 6, 2007
Filed:
Apr 14, 2004
Appl. No.:
10/824555
Inventors:
Ronald A. Synowicki - Lincoln NE, US
Thomas E. Tiwald - Lincoln NE, US
Assignee:
J.A. Woollam Co., Inc. - Lincoln NE
International Classification:
G01J 4/00
US Classification:
356369
Abstract:
Disclosed is a method for determination of bulk refractive indicies of flowable liquids utilizing thin films thereof on a roughened surface of a rigid or semi-rigid object.

Method Of Analysis Of Multiple Layer Samples

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US Patent:
7239391, Jul 3, 2007
Filed:
Apr 2, 2005
Appl. No.:
11/098669
Inventors:
Ronald A. Synowicki - Lincoln NE, US
Craig M. Herzinger - Lincoln NE, US
Assignee:
J.A. Woollam Co., Inc. - Lincoln NE
International Classification:
G01N 21/41
G01J 4/00
G01B 11/28
US Classification:
356369, 356128, 356630
Abstract:
Spectroscopic ellipsometer system(s) mediated methodology for quantifying layer defining parameters in mathematical models of samples which contain a plurality of layers of different materials, at least some of which are absorbing of electromagentic radiation, wherein an acquired data set is not sufficient to allow definite one for one parameter evaluation, and wherein a global fit procedure can be applied to obtain good parameter starting values for use in a parameter evaluating regression procedure.

Sample Analysis Methodology Utilizing Electromagnetic Radiation

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US Patent:
7385697, Jun 10, 2008
Filed:
May 20, 2004
Appl. No.:
10/849740
Inventors:
John A. Woollam - Lincoln NE, US
Corey L. Bungay - Lincoln NE, US
Thomas E. Tiwald - Lincoln NE, US
Martin M. Liphardt - Lincoln NE, US
Ronald A. Synowicki - Lincoln NE, US
Gregory K. Pribil - Lincoln NE, US
Craig M. Herzinger - Lincoln NE, US
Blaine D. Johs - Lincoln NE, US
James N. Hilfiker - Lincoln NE, US
Assignee:
J.A. Woollam Co., Inc. - Lincoln NE
International Classification:
G01J 4/00
US Classification:
356369
Abstract:
Simultaneous use of wavelengths in at least two ranges selected from RADIO, MICRO, FIR, IR, NIR-VIS-NUV, UV, DUV, VUV EUV, XRAY in a regression procedure to evaluate parameters in mathematical dispersion structures to model dielectric functions.

Sample Investigating System

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US Patent:
7623237, Nov 24, 2009
Filed:
Jun 14, 2006
Appl. No.:
11/452483
Inventors:
Martin M. Liphardt - Lincoln NE, US
Thomas E. Tiwald - Lincoln NE, US
Blaine D. Johs - Lincoln NE, US
Jeffrey S. Hale - Lincoln NE, US
Craig M. Herzinger - Lincoln NE, US
Steven E. Green - Lincoln NE, US
Ping He - Lincoln NE, US
Ronald A. Synowicki - Lincoln NE, US
John A. Woollam - Lincoln NE, US
Assignee:
J.A. Woollam Co., Inc. - Lincoln NE
International Classification:
G01J 4/00
US Classification:
356369
Abstract:
A spectroscopic system for adjusting spacing between an adjacent source/detector as a unit, and a sample, and a reflecting means for directing an incident beam which reflects from said sample back onto said sample and then into the detector along a locus which is in a plane of incidence that is offset from that of the incident beam, or directly from the reflecting means into the detector, including means for reducing reflections of a beam of electromagnetic from the back of a sample, including methodology of use.

Ellipsometric Investigation Of Anisotropic Samples

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US Patent:
7777883, Aug 17, 2010
Filed:
Jun 10, 2008
Appl. No.:
12/157407
Inventors:
Ronald A. Synowicki - Lincoln NE, US
Thomas E. Tiwald - Lincoln NE, US
Assignee:
J.A. Woollam Co., Inc. - Lincoln NE
International Classification:
G01J 4/00
US Classification:
356369, 356364
Abstract:
A system for reducing reflections of a beam of electromagnetic radiation from the opposite, back, surface of an anisotropic sample, including methodology for investigating the incident, front, surface thereof with electromagnetic radiation, and analyzing the data as if the sample is isotropic.

Sample Investigating System And Method Of Use

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US Patent:
8159672, Apr 17, 2012
Filed:
Nov 19, 2009
Appl. No.:
12/592015
Inventors:
Martin M. Liphardt - Lincoln NE, US
Thomas E. Tiwald - Lincoln NE, US
Blaine D. Johs - Lincoln NE, US
Jeffrey S. Hale - Lincoln NE, US
Craig M. Herzinger - Lincoln NE, US
Steven E. Green - Lincoln NE, US
Ping He - Lincoln NE, US
Ronald A. Synowicki - Lincoln NE, US
John A. Woollam - Lincoln NE, US
Assignee:
J.A. Woollam Co., Inc. - Lincoln NE
International Classification:
G01J 4/00
US Classification:
356369, 356364
Abstract:
A spectroscopic system for adjusting spacing between an adjacent source/detector as a unit, and a sample, and a reflecting means for directing an incident beam which reflects from said sample back onto said sample and then into the detector along a locus which is in a plane of incidence that is offset from that of the incident beam, or directly from the reflecting means into the detector, including means for reducing reflections of a beam of electromagnetic from the back of a sample, including methodology of use.
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Ronald A Synowicki from Lincoln, NE, age ~56 Get Report