US Patent:
20150234582, Aug 20, 2015
Inventors:
DRAGOS ADRIAN BADEA - BUCHAREST, RO
PETRU LAURIC - MEDFORD MA, US
Assignee:
FREESCALE SEMICONDUCTOR, INC. - Austin TX
International Classification:
G06F 3/0484
G06F 11/26
Abstract:
A debug configuration tool for configuration of on-chip debug features comprises a database comprising predefined analysis points, each relating to a configurable chip entity, and comprising a configurable condition and a configurable action for the chip entity, a plurality of predefined analysis groups, each relating to a group of configurable chip entities, and comprising a configurable condition and a configurable action for the group of chip entities. The tool comprises a graphical user interface module arranged to display representations of at least some of the analysis points and the analysis groups on different levels of detail, and to receive input from a user to set the configurable conditions and/or actions for the displayed analysis points and the analysis groups. An application program interface module processes data received from the graphical user interface module to obtain debug settings and to communicate the debug settings to a debug target system configuration module.