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Nicholas Littlestone Phones & Addresses

  • 1987 Smith Grade, Santa Cruz, CA 95060
  • 85 Erdman Ave, Princeton, NJ 08540 (831) 421-9297
  • 131 Jefferson Rd, Princeton, NJ 08540
  • Los Alamos, NM
  • Somerville, MA

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Position: Executive, Administrative, and Managerial Occupations

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Degree: High school graduate or higher

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Non-Contact High Resolution Displacement Measurement Technique

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US Patent:
48274364, May 2, 1989
Filed:
Apr 22, 1987
Appl. No.:
7/041873
Inventors:
Andrew P. Sabersky - Santa Cruz CA
Nicholas Littlestone - Santa Cruz CA
Jack E. Abbott - Santa Cruz CA
William J. Gibbons - Modesto CA
Robert R. D'Orazio - Santa Cruz CA
Nathan R. Smith - Stillwater MN
Assignee:
Micro Component Technology, Inc. - Shoreview MN
International Classification:
G01R 3102
US Classification:
364559
Abstract:
Apparatus is disclosed for optically detecting the position of an edge of a workpiece (such as an IC lead tip) in a sensing plane, involving the emission of electromagnetic energy from a known source region in the sensing plane such as to cause the edge to create a shadow having a penumbra in the sensing plane. Two detectors determine the amount of energy which reach two known detection regions in the sensing plane and wholly within the penumbra. The amount of energy detected by one detector determines a first curve in the sensing plane on which the edge must lie, and the amount of energy detected by the other determines a second such curve. The intersection of these two curves fully determines the position of the edge in the sensing plane. Preferably, the source region and both detector regions are all essentially line segments oriented parallel to a z-axis, the two detection regions being disposed axially but spaced from each other. Apparatus is also disclosed for determining a profile of edges on one side of the workpiece.
Nicholas N Littlestone from Santa Cruz, CA, age ~74 Get Report