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Michael J Matthew

from Lowell, MA
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Also known as:
Micheal Matthew
Phone and address:
145 Cross St, Lowell, MA 01854
(978) 455-2359
Related to:
Dee Ryan
Connected to:
Adrana J Matthews, 42Afton R Matthews, 28Alberta Matthews, 59Alexis Matthews, 50Alfred W Matthews, 56Aline W Matthews, 112Amaree K Matthews, 45Anna R Matthews, 84Ariane E Matthews, 32Aundrea L Matthews, 52

Michael Matthew Phones & Addresses

  • 145 Cross St, Lowell, MA 01854 (978) 455-2359
  • Frederiksted, VI
  • Stone Mountain, GA

Business Records

Name / Title
Company / Classification
Phones & Addresses
Michael W. Matthew
Principal Scientist
Spectral Sciences, Inc.
Research · Commercial Physical Research · Other Technical Consulting Svcs
4 4 Ave, Burlington, MA 01803
(781) 273-4770, (781) 270-1161

Publications

Us Patents

Methods For Atmospheric Correction Of Solar-Wavelength Hyperspectral Imagery Over Land

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US Patent:
7337065, Feb 26, 2008
Filed:
Jan 23, 2001
Appl. No.:
09/767539
Inventors:
Steven M. Adler-Golden - Newtonville MA, US
Michael Matthew - Westford MA, US
Alexander Berk - Sharon MA, US
Lawrence S. Bernstein - Lexington MA, US
Gail Anderson - Boulder CO, US
Assignee:
Spectral Sciences, Inc. - Burlington MA
International Classification:
G01W 1/00
US Classification:
702 3, 702 5
Abstract:
This invention discloses several improved methods of correcting for atmospheric effects on a remote image of the Earth's surface taken from above, wherein the image comprises a number of simultaneously acquired images of the same scene, each including a large number of pixels, each at a different wavelength band, and including infrared through ultraviolet wavelengths. One method is for retrieving the aerosol/haze amount (i. e. , visible range) from an assumed ratio of in-band reflectances, rather than from an assumed reflectance value. Another method is for identifying cloud-containing pixels. This is used to improve the calculation of the spatially averaged radiance L*and reflectance ρimages in standard equations. Another method greatly reduces the number of mathematical operations required to generate the reflectance values. This method operates by averaging the water vapor and ρvalues over small groups of neighboring pixels, so that the same A, B, S, L*parameter values may also be assigned to all pixels within the group.

Infrared Molecular Species Monitor

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US Patent:
47822325, Nov 1, 1988
Filed:
Sep 22, 1986
Appl. No.:
6/909918
Inventors:
Lawrence S. Bernstein - Bedford MA
Michael W. Matthew - Burlington MA
Fritz Bien - Concord MA
Assignee:
Spectral Sciences, Inc. - Burlington MA
International Classification:
G01N 2161
US Classification:
250343
Abstract:
An infrared monitor for measuring the presence of at least one gas phase molecular species including a sample path for containing a sample to be monitored for the molecular species. A sample beam of infrared source emission of the molecular species to be monitored for passage through the sample path is provided to the sample path. The sample beam includes at least one primary spectral emission line which is significantly absorbed by the molecular species. The decrease in the intensity of the at least one primary infrared source spectral emission line passing through the sample path is detected as a function of the absorption of the at least one line by the molecular species present in the sample.

Infrared Species Specific Emission Source

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US Patent:
47806133, Oct 25, 1988
Filed:
Sep 22, 1986
Appl. No.:
6/909706
Inventors:
Lawrence S. Berstein - Bedford MA
Michael W. Matthew - Burlington MA
Fritz Bien - Concord MA
Assignee:
Spectral Sciences, Inc. - Burlington MA
International Classification:
H01J 6504
US Classification:
250343
Abstract:
An infrared species specific emission source which includes a closed container having at least one transparent portion for containing at least one specific molecular species. The molecular species within the container is heated sufficiently to cause the species to emit a characteristic infrared spectal emission through the at least one transparent portion of the container to the infrared instrument.

Infrared Trace Element Detection System

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US Patent:
47851848, Nov 15, 1988
Filed:
May 27, 1986
Appl. No.:
6/866891
Inventors:
Fritz Bien - Concord MA
Lawrence S. Bernstein - Bedford MA
Michael W. Matthew - Burlington MA
Assignee:
Spectral Sciences, Inc. - Burlington MA
International Classification:
G01N 2161
US Classification:
250343
Abstract:
An infrared trace element detection system including an optical cell into which the sample fluid to be examined is introduced and removed. Also introduced into the optical cell is a sample beam of infrared radiation in a first wavelength band which is significantly absorbed by the trace element and a second wavelength band which is not significantly absorbed by the trace element for passage through the optical cell through the sample fluid. The output intensities of the sample beam of radiation are selectively detected in the first and second wavelength bands. The intensities of a reference beam of the radiation are similarly detected in the first and second wavelength bands. The sensed output intensity of the sample beam in one of the first and second wavelength bands is normalized with respect to the other and similarly, the intensity of the reference beam of radiation in one of the first and second wavelength bands is normalized with respect to the other. The normalized sample beam intensity and normalized reference beam intensity are then compared to provide a signal from which the amount of trace element in the sample fluid can be determined.

Surface Contamination Sensor

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US Patent:
50627074, Nov 5, 1991
Filed:
Nov 6, 1990
Appl. No.:
7/609875
Inventors:
Steven Adler-Golden - Newtonville MA
Michael W. Matthew - Burlington MA
Assignee:
Spectral Sciences, Inc. - Burlington MA
International Classification:
G01N 2171
G01N 2188
US Classification:
356311
Abstract:
An ambient surface contamination sensor including a source for supplying gas, which is energized before it reaches the surface being sensed so that it is capable of transferring energy to the contaminants on the surface or vapor originating therefrom. The sensor then detects the optical emission from the gas passed over the surface within a selected wavelength band characteristic of the presence on the surface of the contaminant, and indicates the presence of the contaminant on the surface when such an emission is detected.
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Michael J Matthew from Lowell, MA Get Report