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Michael S Idelchik

from Schenectady, NY

Michael Idelchik Phones & Addresses

  • 1497 Fox Hollow Rd, Schenectady, NY 12309
  • Niskayuna, NY
  • 10512 Beechwood Ct, Thiensville, WI 53092 (262) 241-8129
  • Mequon, WI
  • Pepper Pike, OH
  • Danbury, CT
  • Swampscott, MA

Work

Company: Ge global research Jul 1978 to 2017 Position: Vice president advanced technology

Education

School / High School: Columbia University In the City of New York

Skills

Cross Functional Team Leadership • Research and Development

Industries

Research

Professional Records

License Records

Michael S Idelchik

License #:
33034 - Expired
Issued Date:
Feb 20, 1987
Expiration Date:
Jun 30, 1990
Type:
Mechanical Engineer

Resumes

Resumes

Michael Idelchik Photo 1

Michael Idelchik

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Location:
Schenectady, NY
Industry:
Research
Work:
Ge Global Research Jul 1978 - 2017
Vice President Advanced Technology

Ge 2002 - 2004
Vice President, China Technology Center
Education:
Columbia University In the City of New York
Massachusetts Institute of Technology
Skills:
Cross Functional Team Leadership
Research and Development

Publications

Us Patents

Method For Quality Function Deployment

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US Patent:
6351680, Feb 26, 2002
Filed:
May 14, 1999
Appl. No.:
09/312690
Inventors:
Mohamed Ahmed Ali - Niskayuna NY
Bharat Sampathkumaran Bagepalli - Niskayuna NY
Bijan Dorri - Clifton Park NY
Thomas Gerard Ebben - Sullivan WI
Aniruddha Dattatraya Gadre - Niskayuna NY
Michael Solomon Idelchik - Mequon WI
Brian Douglas Lounsberry - Thiensville WI
Arlie Russell Martin - Ballston Spa NY
Mark Alan Preston - Niskayuna NY
Raymond Kelsey Seymour - Plainville CT
Douglas J. Snyder - Brookfield WI
Assignee:
General Electric Company - Schenectady NY
International Classification:
G06F 1900
US Classification:
700109, 700 97
Abstract:
An exemplary embodiment of the invention is directed to a method for performing quality function deployment for a system having a plurality of levels. The method includes obtaining a plurality of first level critical to quality parameters and obtaining a plurality of first level key control parameters. A first level quality matrix is generated identifying an effect at least one first level key control parameter has on at least one first level critical to quality parameter. The first level key control parameters are arranged into a first group and a second group. A second level quality matrix is generated for the first group. The second level quality matrix includes second level critical to quality parameters corresponding to the first group of first level key control parameters and a second level key control parameter. The second level quality matrix identifies an effect said second level key control parameter has on at least one second level critical to quality parameter.

Method For Optimizing Transfer Function Outputs

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US Patent:
6377908, Apr 23, 2002
Filed:
May 14, 1999
Appl. No.:
09/312689
Inventors:
Michael Charles Ostrowski - Glenville NY
Mohamed Ahmed Ali - Niskayuna NY
Bijan Dorri - Clifton Park NY
Michael Solomon Idelchik - Mequon WI
Arlie Russell Martin - Ballston Spa NY
Douglas J. Snyder - Brookfield WI
Assignee:
General Electric Company - Schenectady NY
International Classification:
G06F 1710
US Classification:
703 2, 700 30
Abstract:
A product design tradeoff method is provided. A transfer function, which generates an output in response to an input is obtained. A type of optimization to be performed is identified and the input to the transfer function is perturbed in order to achieve the type of optimization identified. Output information representing the output of the transfer function is then generated to provide the user with the result of the optimization. Generating the output information comprises generating a sensitivity matrix. The sensitivity matrix comprises a plurality of sensitivity values that indicates a relationship between a change in input versus a change in output, wherein each of the sensitivity values provides a corresponding numerical value for comparing an effect of the change in the input versus the change in the output.

Method For Performing Design Trade-Off

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US Patent:
6405344, Jun 11, 2002
Filed:
May 14, 1999
Appl. No.:
09/312688
Inventors:
Mohamed Ahmed Ali - Niskayuna NY
Vivek Bhatt - Wauwatosa WI
Bijan Dorri - Clifton Park NY
Thomas Gerard Ebben - Sullivan WI
Michael Solomon Idelchik - Mequon WI
Brian Douglas Lounsberry - Thiensville WI
Arlie Russell Martin - Ballston Spa NY
Michael Charles Ostrowski - Glenville NY
Douglas J. Snyder - Brookfield WI
Assignee:
General Electric Company - Schenectady NY
International Classification:
G06F 1750
US Classification:
716 2, 716 1
Abstract:
A method for performing design trade-off. A plurality of critical to quality parameters corresponding to features of the design are obtained. A plurality of design specifications, each design specification corresponding to one of the critical to quality parameters, are also obtained. A plurality of designs are obtained where each design includes a plurality of design values and each design value corresponds to one of the critical to quality parameters. The design values are compared to the design specifications for each of the plurality of designs. A total score is generated for each design in response to the comparison.

Method And Apparatus For Configuring And Monitoring A System Unit In A Medical Diagnostic System

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US Patent:
6412980, Jul 2, 2002
Filed:
Dec 30, 1999
Appl. No.:
09/476713
Inventors:
Brian D. Lounsberry - Thiensville WI
Jonathan R. Schmidt - Wales WI
Stephen W. Gravelle - Mequon WI
Michael S. Idelchik - Mequon WI
James S. Shepard - Montclair NJ
Assignee:
GE Medical Systems Global Technology Company, LLC - Waukesha WI
International Classification:
H05G 154
US Classification:
378207, 378114
Abstract:
A method for configuring and monitoring a system unit in a medical diagnostic system includes establishing a communication connection between the medical diagnostic system and a remote facility, communicating characteristic information regarding operation of the system unit in the medical diagnostic system from the remote facility to the medical diagnostic system, configuring the medical diagnostic system in accordance with the characteristic information regarding operation of the system unit, and monitoring the operation information of the system unit in the medical diagnostic system using an operator workstation at the medical diagnostic system. A corresponding apparatus includes a storage medium coupled to the system unit which stores information for the system unit in the medical diagnostic system and a communication interface configured to allow communications between the medical diagnostic system and a remote facility. The communications provide for the configuring of the medical diagnostic system to accept the system unit and for monitoring of the system unit.

Integral Lamp

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US Patent:
6459215, Oct 1, 2002
Filed:
Aug 11, 2000
Appl. No.:
09/637768
Inventors:
Louis R. Nerone - Brecksville OH
David J. Kachmarik - Strongsville OH
Joseph C. Oberle - Chagrin Falls OH
Michael S. Idelchik - Mequon WI
Assignee:
General Electric Company - Schenectady NY
International Classification:
G05F 100
US Classification:
315291, 315 58, 315209 R, 315307
Abstract:
An integrated lamp/lamp electronics unit includes a lamp having a first end with first end electrical terminals, and a second end with second end electrical terminals. An end cap having an interior section is placed into electrical connection with the first end electrical terminals at the first end of the lamp. Lamp electronics are configured to control operation of the lamp and are connected only to the second end electrical terminals. The lamp electronics are carried on a circuit board having a configuration substantially matching the second end of the lamp portion. The circuit board is placed within the interior of a lamp electronics end cap, and the end cap is attached in a permanent relationship to the second end of the lamp.

Method And Apparatus For Communicating Operational Data For A System Unit In A Medical Diagnostic System

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US Patent:
6574518, Jun 3, 2003
Filed:
Nov 29, 1999
Appl. No.:
09/450074
Inventors:
Brian D. Lounsberry - Thiensville WI
Jonathan R. Schmidt - Wales WI
Stephen W. Gravelle - Mequon WI
Michael S. Idelchik - Mequon WI
James S. Shepard - Montclair NJ
Assignee:
General Electric Company - Schenectady NY
International Classification:
G06F 1700
US Classification:
700 90, 378162, 378207, 235375
Abstract:
A method for communicating operational data for a system unit in a medical diagnostic system includes communicating identification information from an electronic device coupled to the system unit in the medical diagnostic system to an imaging unit in said medical diagnostic system, operating the medical diagnostic system in accordance with the identification information and generating operational data, and communicating the operational data to the system unit in order to establish a record of operational data for the system unit in the electronic device. The operational data includes information relating to the operation of the system unit in the medical diagnostic system. A corresponding apparatus includes a storage medium, a communication interface, and a programmed digital processing circuit coupled to the storage medium and the communication interface. The storage medium contains identification information for a system unit in a medical diagnostic system and a memory location for a record of operational data for the system unit. The communication interface is configured to allow for the communication between the system unit and the medical diagnostic system of identification information and operational data regarding the system unit.

Integral Lamp

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US Patent:
7102298, Sep 5, 2006
Filed:
Aug 5, 2002
Appl. No.:
10/212358
Inventors:
Louis R. Nerone - Brecksville OH, US
David J. Kachmarik - Strongsville OH, US
Joseph C. Oberle - Chagrin Falls OH, US
Michael S. Idelchik - Mequon WI, US
Assignee:
General Electric Company - Schenectady NY
International Classification:
G05G 1/00
US Classification:
315291, 315 58, 315209 R
Abstract:
An integrated lamp/lamp electronics unit includes a lamp having a first end with first end electrical terminals, and a second end with second end electrical terminals. An end cap having an interior section is placed into electrical connection with the first end electrical terminals at the first end of the lamp. Lamp electronics are configured to control operation of the lamp and are connected only to the second end electrical terminals. The lamp electronics are carried on a circuit board having a configuration substantially matching the second end of the lamp portion. The circuit board is placed within the interior of a lamp electronics end cap, and the end cap is attached in a permanent relationship to the second end of the lamp.

Method And Apparatus For Associating A Field Replaceable Unit With A Medical Diagnostic System And Recording Operational Data

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US Patent:
7107189, Sep 12, 2006
Filed:
Nov 29, 1999
Appl. No.:
09/450264
Inventors:
Brian D. Lounsberry - Thiensville WI, US
Jonathan R. Schmidt - Wales WI, US
Stephen W. Gravelle - Mequon WI, US
Michael S. Idelchik - Mequon WI, US
James S. Shepard - Montclair NJ, US
Assignee:
General Electric Company - Schenectady NY
International Classification:
H05G 1/54
US Classification:
702188
Abstract:
A method for associating a field replaceable unit with a medical diagnostic system includes querying for information on a field replaceable unit to be associated with a medical diagnostic system by sending a query to an electronic device associated with the field replaceable unit, receiving information on the field replaceable unit, and configuring the medical diagnostic system in accordance with the information. A corresponding apparatus includes a storage medium physically coupled to the field replaceable unit and a programmed digital processing circuit coupled to the storage medium. The storage medium contains identification information for a field replaceable unit. The processing circuit responds to requests for identification information from the medical diagnostic system.
Michael S Idelchik from Schenectady, NY Get Report