US Patent:
20130018623, Jan 17, 2013
Inventors:
Igor Sokolov - Potsdam NY, US
Maxim Evgenevich Dokukin - Potsdam NY, US
Assignee:
CLARKSON UNIVERSITY - Potsdam NY
International Classification:
G01M 7/02
G06F 19/00
Abstract:
The present invention provides an apparatus and method including hardware and software, which allows collecting and analyzing of data to obtain information about mechanical properties of soft materials. This allows surface mapping of viscoelastic properties in a high-resolution and fast manner. It also allows finding the degree of nonlinearity of the material response of the sample during the measurements. The apparatus can be used as a stand-alone device, or an add-on to either the existing atomic force microscope or nanoindenter device.