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Mark Lakritz Phones & Addresses

  • Arlington, MA
  • Cambridge, MA
  • 6 Shaker Ct, New Windsor, NY 12553 (845) 565-9683
  • Newburgh, NY
  • Somerville, MA
  • Cedarhurst, NY
  • 6 Shaker Ct, New Windsor, NY 12553

Work

Position: Professional/Technical

Education

Degree: Graduate or professional degree

Publications

Us Patents

Method For Forming Elongated Solder Connections Between A Semiconductor Device And A Supporting Substrate

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US Patent:
45456100, Oct 8, 1985
Filed:
Nov 25, 1983
Appl. No.:
6/555264
Inventors:
Mark N. Lakritz - Wappingers Falls NY
Jose Ordonez - Pleasant Valley NY
Peter J. Tubiola - Wappingers Falls NY
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
H01L 2144
US Classification:
29589
Abstract:
A process for forming elongated solder terminals to connect a plurality of pads on a semiconductor device to a corresponding plurality of pads on a supporting substrate by, forming a means to maintain a predetermined vertical spacing between the semiconductor and the supporting substrate outside the area of the pads, forming and fixing solder extenders to each of the solder wettable pads on the substrate or the device to be joined, positioning the semiconductor device provided with solder mounds on the solder mountable pads over the supporting substrate with the solder mound in registry and with the pads on the substrate with the solder extenders positioned therebetween, the means to maintain vertical spacing located between and in abutting relation to the device and substrate, and heating the resulting assembly to reflow the solder mounds and the solder extenders while maintaining a predetermined spacing thus forming a plurality of hour-glass shaped elongated connections.

Elimination Of Etch Stop Undercut

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US Patent:
51183820, Jun 2, 1992
Filed:
Aug 10, 1990
Appl. No.:
7/565574
Inventors:
John E. Cronin - Milton VT
Mark N. Lakritz - New Windsor NY
Assignee:
IBM Corporation - Armonk NY
International Classification:
H01L 2100
US Classification:
156643
Abstract:
Two methods for wet etch removing an etch stop layer without leaving an undesired undercut are disclosed. In the first method, a reactive ion etch is stopped on an etch stop layer. The exposed etch stop is wet etch removed, leaving an undesirable undercut. The undercut is filled by chemical vapor deposition of a fill material. The filler is then etched to leave a smooth aperture without undercuts. This last etch may be a sputter etch followed by a plasma etch. In the second method, a reactive ion etch is stopped on an etch stop layer as in the first method. Sacrificial sidewalls are then formed within the aperture. The exposed etch stop layer is then removed by wet etching, the positioning of the sidewalls serving to prevent undercutting of the etch stop layer. Finally, the sacrificial sidewalls are etched.
Mark N Lakritz from Arlington, MA, age ~65 Get Report