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Mark D Heerema

from Portola Valley, CA
Age ~66
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Also known as:
Mark David Heerema, Mark D Heereme, Mark D Hereema
Related to:
Gabrielle M Heerema, 23Paul Duclos, 38Gabby HereemaAnneka Heerema, 30Kimberly A Heerema, 59Markd HeeremaBeverly M Flohr, 80
Connected to:
John L Heerema, 62Christine J Heeren, 67Demaree D Heeren, 69Gerald K Heeren, 73Paul J Heeren, 60Tammo Heeren, 53Trevor S Heeren, 29Rachel Heeres, 39Ruth A Heeres, 73Gurpreet Heerey, 55

Mark Heerema Phones & Addresses

  • Portola Valley, CA
  • San Mateo, CA
  • Pasadena, CA
  • Santa Rosa, CA
  • Camp Meeker, CA
  • La Canada Flintridge, CA
  • Bellevue, WA
  • Los Gatos, CA
  • La Canada Flt, CA
  • 2239 Cummings Dr, Santa Rosa, CA 95404

Work

Company: Wikiemc Nov 2012 Position: Experienced emi consultant

Education

Degree: B Sc. School / High School: Michigan Technological University 1979 to 1981 Specialities: Electrical Engineering

Skills

Electronics • Spectrum Analyzer • Signal Integrity • Electromagnetics • Labview • RF design • Pspice • R&D • Troubleshooting • Cross-functional Team Leadership • RF • PCB design • Test Equipment • ANSYS • Integrated Circuit Design • Engineering Management • Electrical Engineering • Electromagnetic Compatibility • Testing • Analog

Awards

Graduated with honors

Interests

high speed design, software tools,http:/...

Industries

Electrical/Electronic Manufacturing

Resumes

Resumes

Mark Heerema Photo 1

Experienced Emi Consultant At Wikiemc

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Position:
Experienced EMI Consultant at wikiEMC
Location:
San Francisco Bay Area
Industry:
Electrical/Electronic Manufacturing
Work:
wikiEMC since Nov 2012
Experienced EMI Consultant
L-3 Communications - Santa Rosa, CA May 2010 - Nov 2012
Senior EMI Engineer
wikiEMC Jun 2008 - May 2010
EMC and Signal Integrity Consultant
Agilent Technologies Mar 2004 - Jun 2008
Project Manager for EMC Measuring Tools
Brocade Feb 2000 - May 2002
Senior EMC Engineer
Education:
Michigan Technological University 1979 - 1981
B Sc., Electrical Engineering The University of Calgary 1976 - 1979
B Sc., Engineering Ernest Manning HS 1973 - 1976
Skills:
Electronics
Spectrum Analyzer
Signal Integrity
Electromagnetics
Labview
RF design
Pspice
R&D
Troubleshooting
Cross-functional Team Leadership
RF
PCB design
Test Equipment
ANSYS
Integrated Circuit Design
Engineering Management
Electrical Engineering
Electromagnetic Compatibility
Testing
Analog
Interests:
high speed design, software tools,http://markheerema.blogspot.com/ instrumentation, IEEE, R&D engineering, marketing, swimming, bicycling, history, sailing, skiing
Honor & Awards:
Graduated with honors

Business Records

Name / Title
Company / Classification
Phones & Addresses
Mark Heerema
Sales And Marketing Manager
Regency Enterprises, Incorporated
Electrical Apparatus and Equipment
16665 Arminta St, Van Nuys, CA 91406
(818) 901-0255, (818) 901-0118

Publications

Us Patents

Systems And Methods For Providing Signal Analysis Data

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US Patent:
20090085555, Apr 2, 2009
Filed:
Sep 27, 2007
Appl. No.:
11/862862
Inventors:
Mark D. Heerema - Santa Rosa CA, US
Corydon J. Boyan - Santa Rosa CA, US
Gordon Strachan - Santa Rosa CA, US
International Classification:
G01R 13/22
US Classification:
324 7627
Abstract:
A method for displaying signal analysis data comprises performing a plurality of sweep operations upon a received signal. With the sweep operations, spectral analysis is performed upon a first frequency band of the received signal. Displays are rendered of data generated from the spectral analysis in the first band and a second band different from the first band simultaneously, and the displays in the first band and the second bands are updated according to the sweep operations.

Frequency-Tuneable Filter Calibration

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US Patent:
48581593, Aug 15, 1989
Filed:
Oct 19, 1987
Appl. No.:
7/111843
Inventors:
Lynn M. Wheelwright - Santa Rosa CA
Vicky A. Hansen - Rohnert Park CA
Mark D. Heerema - Santa Rosa CA
Assignee:
Hewlett-Packard Company - Palo Alto CA
International Classification:
G01C 2500
G01R 2300
H03J 308
H03J 300
US Classification:
36457101
Abstract:
An apparatus and method for calibrating a yttrium-iron-garnet-tuned filter (YTF) is disclosed. Instead of using both tune+span information from the 1st LO, only the sweep ramp used to span the 1st LO is used for the YTF's s own swept spans, and the YTF has its own tune information created independently of tune of the YIG oscillator. This allows calibration at any time, both in the factory or in the field.
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Mark D Heerema from Portola Valley, CA, age ~66 Get Report