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Manjunath Sirigiri

from Frisco, TX
Age ~39
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Connected to:
Srinivasa R Sirigiri, 49Audrey L Sirignano, 69Jennifer A Sirigu, 66Pakpoom Sirihongthong, 41Prashanth Sirikonda, 32Melina S Sirimson, 61Cem Sirin, 49Beverly R Siringo, 93Brian K Siringo, 50Mark S Sirinides, 68

Manjunath Sirigiri Phones & Addresses

  • Frisco, TX
  • 17819 Merridy St APT 300, Northridge, CA 91325
  • 8803 Darby Ave, Northridge, CA 91325
  • 18012 Hiawatha St, Porter Ranch, CA 91326
  • 19607 Monarch Ridge Dr, Canyon Country, CA 91351

Work

Company: Medtronic Jun 2007 Position: Associate electrical engineer

Education

School / High School: California State University 2008 Specialities: Master of Science in Electrical Engineering

Skills

Altium Designer • Orcad Schematic • Orcad Layout • Verilog • SystemVerilog • VHDL • Design Compiler • Labview • Labwindows • ASM

Resumes

Resumes

Manjunath Sirigiri Photo 1

Johnson Grammar School

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Location:
Northridge, CA
Industry:
Electrical/Electronic Manufacturing
Work:
Abbott
Senior Electrical Development Quality Engineer
Abbott Aug 2016 - Sep 2018
Electrical Development Quality Engineer Ii
Medtronic Jun 2015 - Aug 2016
Electrical Engineer
Medtronic Dec 2010 - Jun 2015
Associate Electrical Engineer
Sdk Oct 2008 - Nov 2010
Electrical Engineer
Education:
Rice University 2014 - 2014
California State University, Northridge Dec 2008
California State University, Northridge 2006 - 2008
Master of Science, Masters, Electrical Engineering Jawaharlal Nehru Technological University May 2006
Bachelors, Bachelor of Arts Jawaharlal Nehru Technological University 2002 - 2006
Bachelors, Bachelor of Technology, Electronics, Engineering, Communications Johnson Grammar School
Skills:
Medical Devices
Electronics
Labview
Altium Designer
Labwindows/Cvi
Orcad Capture Cis
Arm Cortex M3
Low Power Systems
Manjunath Sirigiri Photo 2

Manjunath Sirigiri

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Manjunath Sirigiri Photo 3

Manjunath Sirigiri Northridge, CA

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Work:
Medtronic

Jun 2007 to Present
Associate Electrical Engineer
Education:
California State University
2008
Master of Science in Electrical Engineering
Jawaharlal Nehru Technological University
Hyderabad, Andhra Pradesh
2006
Bachelor of technology in Electronics and Communications Engineering
Skills:
Altium Designer, Orcad Schematic, Orcad Layout,Verilog, SystemVerilog, VHDL, Design Compiler, Labview, Labwindows, ASM

Publications

Us Patents

Application Of Electrochemical Impedance Spectroscopy In Sensor Systems, Devices, And Related Methods

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US Patent:
20130331674, Dec 12, 2013
Filed:
Feb 27, 2013
Appl. No.:
13/778630
Inventors:
Raghavendhar Gautham - Los Angeles CA, US
Bradley C. Liang - Bloomfield Hills MI, US
Rajiv Shah - Rancho Palos Verdes CA, US
Catherine M. Szyman - Westlake Village CA, US
Michael E. Miller - Culver City CA, US
Yiwen Li - Arcadia CA, US
Wayne A. Morgan - Northridge CA, US
Paris Chen - Chino Hills CA, US
Robert C. Mucic - Glendale CA, US
Genival D. de Barros - Porter Ranch CA, US
Carlos A. Callirgos - Northridge CA, US
Manjunath Sirigiri - Northridge CA, US
Joseph Paul Brinson - Valencia CA, US
International Classification:
G01R 35/00
A61B 5/145
US Classification:
600347, 324600, 324601, 702 65
Abstract:
A diagnostic Electrochemical Impedance Spectroscopy (EIS) procedure is applied to measure values of impedance-related parameters for one or more sensing electrodes. The parameters may include real impedance, imaginary impedance, impedance magnitude, and/or phase angle. The measured values of the impedance-related parameters are then used in performing sensor diagnostics, calculating a highly-reliable fused sensor glucose value based on signals from a plurality of redundant sensing electrodes, calibrating sensors, detecting interferents within close proximity of one or more sensing electrodes, and testing surface area characteristics of electroplated electrodes. Advantageously, impedance-related parameters can be defined that are substantially glucose-independent over specific ranges of frequencies. An Application Specific Integrated Circuit (ASIC) enables implementation of the EIS-based diagnostics, fusion algorithms, and other processes based on measurement of EIS-based parameters.

Application Of Electrochemical Impedance Spectroscopy In Sensor Systems, Devices, And Related Methods

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US Patent:
20130328578, Dec 12, 2013
Filed:
Feb 27, 2013
Appl. No.:
13/778473
Inventors:
Robert C. Mucic - Glendale CA, US
Genival D. de Barros - Porter Ranch CA, US
Carlos A. Callirgos - Northridge CA, US
Manjunath Sirigiri - Northridge CA, US
Joseph Paul Brinson - Valencia CA, US
Assignee:
MEDTRONIC MINIMED, INC. - Northridge CA
International Classification:
G01N 27/02
US Classification:
324693
Abstract:
A diagnostic Electrochemical Impedance Spectroscopy (EIS) procedure is applied to measure values of impedance-related parameters for one or more sensing electrodes. The parameters may include real impedance, imaginary impedance, impedance magnitude, and/or phase angle. The measured values of the impedance-related parameters are then used in performing sensor diagnostics, calculating a highly-reliable fused sensor glucose value based on signals from a plurality of redundant sensing electrodes, calibrating sensors, detecting interferents within close proximity of one or more sensing electrodes, and testing surface area characteristics of electroplated electrodes. Advantageously, impedance-related parameters can be defined that are substantially glucose-independent over specific ranges of frequencies. An Application Specific Integrated Circuit (ASIC) enables implementation of the EIS-based diagnostics, fusion algorithms, and other processes based on measurement of EIS-based parameters.
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Manjunath Sirigiri from Frisco, TX, age ~39 Get Report