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Lukas Leonore M Novotny

from Pittsford, NY
Age ~57
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Also known as:
Lukas Leonore Novotny, Lucas Leonore Novotny, Leonore Novotny Lucas
Connected to:
Amy R Novotny, 54Cynthia R Novotny, 45Damian P Novotny, 42Darla J Novotny, 43Debra S Novotny, 65Emily A Novotny, 39Irma J Novotny, 82Joan C Novotny, 81Joshua J Novotny, 46Kathleen E Novotny, 62

Lukas Novotny Phones & Addresses

  • Pittsford, NY
  • 316 Countess Dr, West Henrietta, NY 14586
  • 1106 Sanford Ave, Richland, WA 99352 (509) 943-4365
  • 14 Turnberry Ln, Pittsford, NY 14534 (585) 385-8533

Work

Company: Eth May 2012 Position: Professor of photonics

Education

Degree: Associate degree or higher

Industries

Higher Education

Resumes

Resumes

Lukas Novotny Photo 1

Professor Of Photonics, Eth

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Position:
Professor of Photonics at ETH, Professor of Optics and Physics at University of Rochester
Location:
Zürich Area, Switzerland
Industry:
Higher Education
Work:
ETH since May 2012
Professor of Photonics
University of Rochester since Jul 1999
Professor of Optics and Physics

Business Records

Name / Title
Company / Classification
Phones & Addresses
Lukas Novotny
THE MOUNTED ARCHERY ASSOCIATION OF THE AMERICAS, INC
Lukas Novotny
SALUKI BOW CO. , LLC

Publications

Us Patents

System And Method For High Resolution Optical Imaging, Data Storage, Lithography, And Inspection

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US Patent:
7526158, Apr 28, 2009
Filed:
Feb 7, 2002
Appl. No.:
10/068449
Inventors:
Lukas Novotny - Pittsford NY, US
Thomas G. Brown - Rochester NY, US
Assignee:
University of Rochester - Rochester NY
International Classification:
G02B 6/26
US Classification:
385 33, 385 31, 36911223, 359642
Abstract:
A system for applications, such as imaging, lithography, data storage, and inspection, includes an optical element, at least one structure, and a source of light. The structure is at least partially in and at least adjacent a surface of the optical element. The source of light has a mode profile that provides an electric field which has a vector component substantially perpendicular to a surface of the optical element. The source of light is positioned to propagate at least a portion of the light through the optical element onto the object. The structure enhances the electric field of the light which optically interacts with the object.

Apparatus And Method For Sizing Nanoparticles Based On Interferometric Field Detection

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US Patent:
7528959, May 5, 2009
Filed:
Mar 4, 2008
Appl. No.:
12/041873
Inventors:
Lukas Novotny - Rochester NY, US
Filipp Ignatovich - Rochester NY, US
Assignee:
University of Rochester - Rochester NY
International Classification:
G01B 11/02
US Classification:
356496
Abstract:
Light from a laser source is split into a reference arm and a detection arm. The light in the detection arm is focused into a channel containing particles to be detected and is backscattered by the particles. The light in the reference arm is attenuated. The attenuated and backscattered light are caused to interfere and detected by a split detector so that the effects of background light can be subtracted out, while the backscattered light is detected to detect the particles.

Common-Path Interferometer Rendering Amplitude And Phase Of Scattered Light

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US Patent:
7876450, Jan 25, 2011
Filed:
Sep 15, 2008
Appl. No.:
12/210693
Inventors:
Lukas Novotny - Pittsford NY, US
Bradley Deutsch - Rochester NY, US
Assignee:
University of Rochester - Rochester NY
International Classification:
G01B 9/02
US Classification:
356491
Abstract:
A beam of coherent laser light with linear polarization oriented at 45 degrees to vertical is expanded, and passes through a quarter-wave plate with the fast axis oriented vertically, creating circularly polarized light. The light then passes through a non-polarizing 50/50 beamsplitter. A partial reflector then collinearly reflects a portion of the beam, which is used as the reference beam. The transmitted light passes through a linear polarizer oriented at 45 degrees to vertical, and is focused via a lens onto the sample of interest. Light scattered from this region is re-collimated by the lens and the directed through the linear 45 degree polarizer and through the partial reflector, where it recombines with the reference beam. One use of the invention is to detect microparticles in water.

Apparatus And Method For Sizing Nanoparticles Based On Optical Forces And Interferometric Field Detection

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US Patent:
20070030492, Feb 8, 2007
Filed:
May 4, 2006
Appl. No.:
11/417254
Inventors:
Lukas Novotny - Rochester NY, US
Filipp Ignatovich - Rochester NY, US
International Classification:
G01B 11/02
US Classification:
356498000
Abstract:
Light from a laser source is split into a reference arm and a detection arm. The light in the detection arm is focused into a channel containing particles to be detected and is backscattered by the particles. The light in the reference arm is attenuated. The attenuated and backscattered light are caused to interfere and detected by a split detector so that the effects of background light can be subtracted out, while the backscattered light is detected to detect the particles.

Multi-Color Hetereodyne Interferometric Apparatus And Method For Sizing Nanoparticles

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US Patent:
20090323061, Dec 31, 2009
Filed:
Feb 27, 2007
Appl. No.:
11/710976
Inventors:
Lukas Novotny - Pittsford NY, US
Filipp Ignatovich - Rochester NY, US
International Classification:
G01N 15/02
G01B 9/02
US Classification:
356336, 356484, 977773
Abstract:
A nanoparticle sensor is capable of detecting and recognizing single nanoparticles in an aqueous environment. Such sensor may find applications in broad areas of science and technology, from the analysis of diesel engine emissions to the detection of biological warfare agents. Particle detection is based on interferometric detection of multi-color light, scattered by the particle. On the fundamental level, the detected signal has a weaker dependence on particle size (ÿ R), compared to standard detection methods (ÿ R). This leads to a significantly larger signal-to-noise ratio for smaller particles. By using a multi-color or white excitation light, particle dielectric properties are probed at different frequencies. This scheme samples the frequency dependence of the particle's polarizability thereby making it possible to predict the composition of the particle material. The detection scheme also employs a heterodyne or pseudoheterodyne detection configuration, which allows it to reduce or eliminate noise contribution from phase variations, which appear in any interferometric measurements.

Stacked Optical Antenna Structures, Methods And Applications

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US Patent:
20120040127, Feb 16, 2012
Filed:
Aug 12, 2011
Appl. No.:
13/208664
Inventors:
Lukas Novotny - Pittsford NY, US
Wolfgang Dieter Pohl - Adliswil, CH
Assignee:
University of Rochester - Rochester NY
International Classification:
B32B 3/00
B32B 37/00
US Classification:
428 77, 156 60
Abstract:
A stacked optical antenna structure includes a stacked structure including: (1) a first antenna arm located over a substrate; (2) an interstitial gap layer located over at least a portion of the first antenna arm; and (3) a second antenna arm located over at least a portion of the interstitial gap layer located over the first antenna arm, and typically incompletely overlapping the first antenna arm. Thus, a gap width of the stacked optical antenna structure is determined by a thickness of the interstitial gap layer rather than a separation distance of antenna arms that may be formed using a photolithographic method. Embodiments also contemplate a method for fabricating the stacked optical antenna that uses the interstitial gap layer as an etch stop layer. The interstitial gap layer may provide any of several functions within the stacked optical antenna structure.

Integrated Microscope And Related Methods And Devices

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US Patent:
20130333077, Dec 12, 2013
Filed:
Feb 23, 2012
Appl. No.:
14/000895
Inventors:
Ryan Murdick - Ann Arbor MI, US
Lukas Novotny - Pittsford NY, US
Assignee:
RHK Technology , Inc. - Trot MI
International Classification:
G01Q 30/02
US Classification:
850 9
Abstract:
An embodiment includes an integrated microscope including scanning probe microscopy (SPM) hardware integrated with optical microscopy hardware, and other embodiments include related methods and devices.

Amazon

Principles Of Nano-Optics Reissue Edition By Novotny, Lukas; Hecht, Bert Published By Cambridge University Press Paperback

Principles of Nano-Optics Reissue Edition by Novotny, Lukas; Hecht, Bert published by Cambridge University Press Paperback

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Binding

Paperback

Publisher

Cambridge University Press

ISBN #

10

Principles Of Nano-Optics By Novotny, Lukas; Hecht, Bert Published By Cambridge University Press Hardcover

Principles of Nano-Optics by Novotny, Lukas; Hecht, Bert published by Cambridge University Press Hardcover

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Binding

Hardcover

Publisher

Cambridge University Press

ISBN #

9

By Lukas Novotny - Principles Of Nano-Optics: 1St (First) Edition

By Lukas Novotny - Principles of Nano-Optics: 1st (first) Edition

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Binding

Unknown Binding

Publisher

Cambridge University Press

ISBN #

8

Glass Collector's Digest: June/July 1996 Volume X, Number 1 (Cast Glass Sculpture by Lukas Novotny and Baker O'Brien Cover)

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Glass Collector's Digest: June/July 1996 Volume X, Number 1 (Cast Glass Sculpture by Lukas Novotny and Baker O'Brien Cover) CONTENTS: Heisey and Its Competitors Looking Back at 1896, Part II by Tom Felt ; O'Brien and Novotny Revisted by Roserita Ziegler ; Glass Egg Cups from 1780 to the 1940's by Br...
Binding

Single Issue Magazine

Pages

96

Publisher

David Richardson, The Glass Press

ISBN #

3

Principles Of Nano-Optics

Principles of Nano-Optics

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Nano-optics is the study of optical phenomena and techniques on the nanometer scale, that is, near or beyond the diffraction limit of light. It is an emerging field of study, motivated by the rapid advance of nanoscience and nanotechnology which require adequate tools and strategies for fabrication,...
Author

Lukas Novotny, Bert Hecht

Binding

Paperback

Pages

558

Publisher

Cambridge University Press

ISBN #

0521539889

EAN Code

9780521539883

ISBN #

4

Mounted Archery In The Americas

Mounted Archery in the Americas

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This fascinating and amply illustrated book charts the history of mounted archery from its ancient roots on the steppes of Eurasia thousands of years ago to its current resurgence in popularity in the Americas. It also provides the reader with up-to-the-minute practical information gleaned from a un...
Binding

Paperback

Pages

292

Publisher

The Long Riders' Guild Press

ISBN #

159048262X

EAN Code

9781590482629

ISBN #

2

Principles Of Nano-Optics

Principles of Nano-Optics

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First published in 2006, this book has become the standard reference on nano-optics. Now in its second edition, the text has been thoroughly updated to take into account new developments and research directions. While the overall structure and pedagogical style of the book remain unchanged, all exis...
Author

Lukas Novotny, Bert Hecht

Binding

Hardcover

Pages

578

Publisher

Cambridge University Press

ISBN #

1107005469

EAN Code

9781107005464

ISBN #

1

Isbn (Books And Publications)

Principles of Nano-optics

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Author

Lukas Novotny

ISBN #

0521832241

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Lukas Leonore M Novotny from Pittsford, NY, age ~57 Get Report