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Louis Gullo Phones & Addresses

  • Sahuarita, AZ
  • 1702 E Saint Bernadine St, Tucson, AZ 85713
  • Marana, AZ
  • Newport News, VA
  • Bristol, RI
  • Lakeville, MA
  • Middletown, RI
  • Concord, MA

Resumes

Resumes

Louis Gullo Photo 1

Engineer

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Location:
Tucson, AZ
Work:
Raytheon
Engineer
Louis Gullo Photo 2

Louis Gullo

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Location:
Tucson, AZ
Industry:
Military
Work:
Valley Protective Services Mar 2013 - Apr 2014
Uniformed Unarmed Security Guard

Us Navy Jun 2008 - Jul 2012
Information Systems Technician

New England Boatworks Sep 2006 - Apr 2008
Travel Lift Operator
Education:
Plano East Senior High 2003 - 2004
Skills:
Navy
Comsec
Information Assurance
Security Clearance
Dod
Communications Security
Military
Military Experience
Louis Gullo Photo 3

Reliability Standards Committee Chair

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Location:
Tucson, AZ
Industry:
Defense & Space
Work:
Raytheon Integrated Defense Systems Sep 2005 - Mar 2011
Senior Principal Systems Engineer

Raytheon Missile Systems Sep 2005 - Mar 2011
Senior Principal Systems Engineer

Ieee Reliability Society Sep 2005 - Mar 2011
Reliability Standards Committee Chair

Reliability and Maintainability Symposium Sep 2005 - Mar 2011
Rams Management Committee

Flextronics Oct 2003 - Aug 2005
Director of Global Product Assurance and Reliability Engineering
Education:
University of Connecticut 1976 - 1980
Bachelors, Bachelor of Science In Electrical Engineering, Electrical Engineering
Skills:
Technology
Reliability Engineering
Science
Engineering
Software
Hardware
Reliability

Publications

Us Patents

Alternative Techniques For Design Of Experiments

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US Patent:
20190383874, Dec 19, 2019
Filed:
Aug 28, 2019
Appl. No.:
16/554206
Inventors:
Holger M. Jaenisch - Toney AL, US
James W. Handley - Toney AL, US
Louis J. Gullo - Marana AZ, US
International Classification:
G01R 31/3183
G06F 17/50
Abstract:
Presented herein are alternatives to design of experiments. A method can include sampling a model that explains a measurement corpus of measurement data to generate a sampled model, identifying an invalid region of the sampled model, determining whether a device will operate within the identified invalid region, if the device will operate within the identified invalid region, causing further measurement data to be captured in the identified invalid region, and generating a new model, based only on the further measurement data, to explain device operation within the identified invalid region that augments the sampled model to explain the device behavior.
Louis J Gullo from Sahuarita, AZ, age ~38 Get Report