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Kerry Pfarr Phones & Addresses

  • 6008 Hampton Ln, Rochester, MN 55901 (507) 281-1508
  • 6008 Hampton Ln NW, Rochester, MN 55901 (507) 250-1460

Work

Company: Ibm 1979 to 2013 Position: Engineer

Education

Degree: Bachelor's degree or higher

Skills

Linux • Unix • Java

Emails

Industries

Information Technology And Services

Resumes

Resumes

Kerry Pfarr Photo 1

Kerry Pfarr

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Location:
Rochester, MN
Industry:
Information Technology And Services
Work:
Ibm 1979 - 2013
Engineer
Skills:
Linux
Unix
Java

Publications

Us Patents

Method, Apparatus And Computer Program Product For Implementing Enhanced Notification And Control Features In Oscilloscopes

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US Patent:
20050060110, Mar 17, 2005
Filed:
Sep 11, 2003
Appl. No.:
10/660031
Inventors:
Steven Jones - Rochester MN, US
Peter Kubista - West Concord MN, US
Kerry Pfarr - Rochester MN, US
Brian Schuelke - Rochester MN, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G01R013/02
US Classification:
702067000
Abstract:
A method, apparatus and computer program product are provided for implementing enhanced notification and control features in an oscilloscope. User selected notification options and user selected control options are stored. When a predefined event is identified, the user selected notification options are used for notifying a remote user of the identified predefined event. The user selected control options are used for receiving user selections enabling the user to remotely control oscilloscope operational settings. The user can be notified with a telephone call, an email or a pager text message and the user can change operational settings using a telephone call or an email containing commands.

Circuit For Detecting Structural Defects In An Integrated Circuit Chip, Methods Of Use And Manufacture And Design Structures

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US Patent:
20120187953, Jul 26, 2012
Filed:
Jan 20, 2011
Appl. No.:
13/010057
Inventors:
Luke D. LACROIX - Williston VT, US
Mark C.H. Lamorey - South Burlington VT, US
Steven F. Oakland - Colchester VT, US
Janak G. Patel - South Burlington VT, US
Kerry P. Pfarr - Rochester MN, US
Peter Slota, JR. - Vestal NY, US
David B. Stone - Jericho VT, US
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION - Armonk NY
International Classification:
G01R 31/02
US Classification:
324537
Abstract:
Detection circuits, methods of use and manufacture and design structures are provided herein. The structure includes at least one signal line traversing one or more metal layers of an integrated circuit. Circuitry is coupled to the at least one signal line, which is structured to receive a signal with a known signal from the at least one signal line or a signal from a different potential and, based on which signal is received, determine whether there is a structural defect in the integrated circuit.

Circuit For Detecting Structural Defects In An Integrated Circuit Chip, Methods Of Use And Manufacture And Design Structures

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US Patent:
20150247896, Sep 3, 2015
Filed:
May 15, 2015
Appl. No.:
14/713626
Inventors:
- Armonk NY, US
Mark C. H. Lamorey - Williston VT, US
Steven F. Oakland - Colchester VT, US
Janak G. Patel - South Burlington VT, US
Kerry P. Pfarr - Rochester MN, US
Peter Slota, JR. - Vestal NY, US
David B. Stone - Jericho VT, US
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION - Armonk NY
International Classification:
G01R 31/28
H01L 21/66
H01L 21/768
Abstract:
Detection circuits, methods of use and manufacture and design structures are provided herein. The structure includes at least one signal line traversing one or more metal layers of an integrated circuit. Circuitry is coupled to the at least one signal line, which is structured to receive a signal with a known signal from the at least one signal line or a signal from a different potential and, based on which signal is received, determine whether there is a structural defect in the integrated circuit.
Kerry P Pfarr from Rochester, MN, age ~67 Get Report