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Kati K Illouz

from Niskayuna, NY
Age ~49
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Also known as:
Kati Illiouz
Phone and address:
146 Front St, Schenectady, NY 12305
Related to:
Eyal Illouz, 48
Connected to:
Joseph G Illovsky, 58James M Illsley, 70Nathan Illsley, 33Penny Illsley, 60Henrik B Illum, 51Kellie Illum, 44Bindu Illuri, 48Christopher Illuzzi, 33Rosalie M Illyes, 77Dale E Ilmi, 94

Kati Illouz Phones & Addresses

  • 146 Front St, Schenectady, NY 12305
  • Niskayuna, NY
  • 5 Circle Ln, Albany, NY 12203 (518) 482-9845
  • Wooster, OH

Work

Company: Ge global research Position: Statistician

Education

Degree: High school graduate or higher

Skills

Algorithms • Data Analysis • R • Statistical Modeling • Statistics

Industries

Research

Resumes

Resumes

Kati Illouz Photo 1

Statistician

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Location:
146 Front St, Schenectady, NY 12305
Industry:
Research
Work:
Ge Global Research
Statistician
Skills:
Algorithms
Data Analysis
R
Statistical Modeling
Statistics

Publications

Us Patents

Method And Apparatus For Estimating Time To Failure Acceleration Factor

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US Patent:
20020161457, Oct 31, 2002
Filed:
Feb 20, 2001
Appl. No.:
09/791034
Inventors:
John Hershey - Ballston Lake NY, US
Brock Estel Osborn - Niskayuna NY, US
Kati Illouz - Albany NY, US
Gerald Burt Kliman - Niskayuna NY, US
Assignee:
General Electric Company
International Classification:
G05B021/02
G05B011/01
G06F019/00
G05B009/02
US Classification:
700/021000, 700/078000, 700/073000, 700/170000, 700/079000
Abstract:
An apparatus for estimating the time to failure acceleration factor of a large industrial includes a sensor, a clock for controlling sensor sampling times, and a memory address calculator for mapping output signals of the sensor to a memory address. A unit is provided for incrementing the content of a specified memory address by unity.

Interactive Graphics-Based Analysis Tool For Visualizing Reliability Of A System And Performing Reliability Analysis Thereon

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US Patent:
20030034995, Feb 20, 2003
Filed:
Jul 3, 2001
Appl. No.:
09/897556
Inventors:
Brock Osborn - Niskayuna NY, US
Radu Neagu - Albany NY, US
Alissa Krupar - Erie PA, US
John Hershey - Ballston Lake NY, US
Kati Illouz - Schenectady NY, US
Carl Hansen - Latham NY, US
Melvin Edgar - Cincinnati OH, US
James Dockendorff - Cincinnati OH, US
Donald Gardner - West Chester OH, US
International Classification:
G09G005/00
US Classification:
345/713000
Abstract:
An interactive graphics-based analysis tool for performing reliability analysis of a system formed from a variety of subsystems and components within each subsystem. The tool uses a hierarchical representation component to organize the system, subsystems and components into a hierarchical representation. An interactive selection component provides different options for analyzing the hierarchical representation. A reliability analysis component, responsive to the hierarchical representation component and the interactive selection component, allows a user to perform a reliability analysis at any level of the hierarchical representation.

Method, System And Computer Product For Prognosis Of A Medical Disorder

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US Patent:
20040242972, Dec 2, 2004
Filed:
May 28, 2003
Appl. No.:
10/446494
Inventors:
Sudeshna Adak - Bangalore, IN
William Gorman - Niskayuna NY, US
Kati Illouz - Schenectady NY, US
Assignee:
General Electric Company
International Classification:
A61B005/00
US Classification:
600/300000, 128/920000
Abstract:
Method, system and computer product for prognosis of a medical disorder. In one embodiment, a request to provide prognosis decision support for the patient is received. Medical data relevant to the patient such as longitudinal medical data is extracted. Predictive modeling techniques relevant to the patient from the longitudinal medical data are derived. The predictive modeling techniques are then used to predict a clinical outcome for the patient from the medical data. The predictive modeling techniques are formulated using data mining techniques that are capable of detecting correlations in repeated measurements associated with the longitudinal medical data. The predictive modeling techniques then utilize the correlations for determining the medical prognosis for the patient.

Method And System For Estimating Gene Expression Data

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US Patent:
20060216718, Sep 28, 2006
Filed:
Mar 23, 2005
Appl. No.:
11/087482
Inventors:
Antonio Possolo - Niskayuna NY, US
Jay Silkworth - Schodack Landing NY, US
Kati Illouz - Schenectady NY, US
International Classification:
C12Q 1/68
G06F 19/00
US Classification:
435006000, 702020000
Abstract:
A method and system are provided for measuring differential gene expression that is induced on multiple experimental subjects by controlled, multiple experimental factors, measured using microarrays or other devices that measure the activity of multiple probes per gene. The information in the readings made from all the probes in the microarrays or other devices that received the experimental samples is extracted simultaneously, without prior summarization or aggregation at the gene level, by employing a multi-factor model that explicitly accounts for differences in expression between genes, between probes from the same gene, and between the effects of the experimental factors.

Optimal Machining Parameter Selection Using A Data-Driven Tool Life Modeling Approach

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US Patent:
20200166905, May 28, 2020
Filed:
Jan 28, 2020
Appl. No.:
16/774286
Inventors:
- Schenectady NY, US
Jayakrishnan Unnikrishnan - Jersey City NJ, US
Andrew Henderson - Simpsonville NC, US
Kati Illouz - Niskayuna NY, US
International Classification:
G05B 19/4065
G05B 19/404
G05B 19/416
Abstract:
Systems, computer-implemented methods and/or computer program products that facilitate generating operating parameters are provided. In one embodiment, a computer-implemented method comprises: generating, by a system operatively coupled to a processor, tool life models using a tool wear data set, wherein the tool wear data set is based on production data or predetermined data; and generating, by the system, operating parameters for machining operations based on the tool life models and baseline operational parameters.

Optimal Machining Parameter Selection Using A Data-Driven Tool Life Modeling Approach

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US Patent:
20190258222, Aug 22, 2019
Filed:
Feb 16, 2018
Appl. No.:
15/932318
Inventors:
- Schenectady NY, US
Jayakrishnan Unnikrishnan - Jersey City NJ, US
Andrew Henderson - Simpsonville SC, US
Kati Illouz - Niskayuna NY, US
International Classification:
G05B 19/4065
G05B 19/404
G05B 19/416
Abstract:
Systems, computer-implemented methods and/or computer program products that facilitate generating operating parameters are provided. In one embodiment, a computer-implemented method comprises: generating, by a system operatively coupled to a processor, tool life models using a tool wear data set, wherein the tool wear data set is based on production data or predetermined data; and generating, by the system, operating parameters for machining operations based on the tool life models and baseline operational parameters.
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Kati K Illouz from Niskayuna, NY, age ~49 Get Report