Joseph Scorsone

6870743, Mar 22, 2005

Mar 17, 2003

10/390355

Keith D. Mease - Gibbstown NJ, US
Sean M. McClain - Havertown PA, US
Joseph J. Scorsone - West Chester PA, US
Daniel A. Jochym - Downingtown PA, US
David H. Chase - Minneapolis MN, US

Unisys Corporation - Blue Bell PA

H05K007/14
H05K005/00

361796, 361752, 361736, 361730, 174 521, 211 4117

A computer module for use in a scalable computer system is provided. The computer module includes a chassis at least partially defining an interior and a processor board configured for insertion into a processor region of the interior of the chassis along an insertion axis. The processor board includes at least one connector for communicating signals to and from the processor board. The connector of the processor board is oriented along a connection axis that is substantially perpendicular to the insertion axis. The computer module also includes a memory board configured for insertion into a memory region of the interior of the chassis along the insertion axis. The memory board includes at least one connector for communicating signals to and from the memory board. The connector of the memory board is oriented along the connection axis.

7281953, Oct 16, 2007

Aug 5, 2005

11/198503

Daniel A. Jochym - Downingtown PA, US
Joseph J. Scorsone - West Chester PA, US

Unisys Corporation - Blue Bell PA

H01R 33/88

439638, 439 77, 361749

Methods and apparatus to configure a computer to receive cards of a first or second card type are disclosed. The computer is configured through the use of an adapter including a flexible cable having a first connector adjacent one end and a second connector adjacent the other end. The computer is configured by coupling the first connector to the computer. Also, a determination is made to receive either the first or the second card types. For a determination to receive the first card type, the flexible cable is bent in a predefined manner to orient the second connector with respect to the first connector to receive the first card type. For a determination to receive the second card type, the flexible cable is bent in another predefined manner to orient the second connector differently with respect to the first connector to receive the second card type.

7508683, Mar 24, 2009

Aug 5, 2005

11/198488

Daniel A. Jochym - Dowingtown PA, US
Joseph J. Scorsone - West Chester PA, US

Unisys Corporation - Blue Bell PA

H05K 9/00

361818, 361816

Methods and apparatus for providing electromagnetic interference (EMI) shielding for a module receiving area within a computer server housing configured to receive an input/output (IO) module are disclosed. The module receiving area is covered with a door. EMI shielding is provided by transitioning the door from a closed position to an open position in response to a force applied by the IO module, maintaining contact between the IO module and the door while the door is open to provide EMI shielding for the module receiving area when the IO module is present, and transitioning the door from the open position to the closed position in response to removal of the force applied by the IO module when the IO module is withdrawn from the module receiving area to provide EMI shielding for the module receiving area when the IO module is not present.

56525249, Jul 29, 1997

Oct 24, 1995

8/547265

Mark W. Jennion - Chester Springs PA
Joseph H. Fell - East Fallowfield PA
Paul H. Selby - Norristown PA
Joseph J. Scorsone - Broomall PA

Unisys Corporation - Blue Bell PA

G01R 3106

324765

An improved load board design having a generic test circuit integrated into the load board capable of functioning with varying devices under test and requires little to no wiring. The test circuit is located in a fixed and optimal position of the load board with relation to the DUT. In a preferred embodiment, the test circuit is a quiescent test circuit for interfacing an integrated circuit tester to the DUT. The quiescent test circuit is capable of supplying high powered voltage to a DUT while the DUT's desired internal state is reached. At this point, the integrated circuit tester, sends an active select signal to the quiescent test circuit instantaneously deselecting the high-powered voltage supply to the DUT and selecting the integrated circuit tester's parametric measurement unit for powering the DUT. The integrated circuit tester, through a parametric measurement unit is capable of measuring the quiescent current of the DUT, while powering the DUT.

57214956, Feb 24, 1998

Oct 24, 1995

8/547353

Mark W. Jennion - Chester Springs PA
Joseph H. Fell III - East Fallowfield PA
Paul H. Selby III - Norristown PA
Joseph J. Scorsone - Broomall PA

Unisys Corporation - Blue Bell PA

G01R 3100

324765

A quiescent test circuit for interfacing a high precision integrated circuit tester to a device under test (DUT). The quiescent test circuit is capable of supplying a high powered (V1) voltage supply to a DUT while the DUT's desired dynamics internal state is reached. At this point, the integrated circuit tester, sends an active select signal to the quiescent test circuit instantaneously which deselects the high-powered (V1) voltage supply to the DUT and selects the integrated circuit tester's parametric measurement unit low power (V4) voltage supply for powering the DUT. The integrated circuit tester, through its parametric measurement unit is capable of precisely measuring the very low quiescent current of the DUT, while powering the DUT.