Jon M Dhuse from 3290 Holly Ct, Chandler, AZ 85248, age 66

Imaging System Having A Sensor Array Reset Noise Reduction Mechanism

View page

US Patent:

6438276, Aug 20, 2002

Filed:

Sep 11, 2000

Appl. No.:

09/659159

Inventors:

Jon M. Dhuse - Chandler AZ
Kevin M. Connolly - Chandler AZ
Mark A. Beiley - Chandler AZ

Assignee:

Intel Corporation - Santa Clara CA

International Classification:

G06K 920

US Classification:

382312

Abstract:

What is disclosed is an apparatus for reducing row reset noise in photodiode based complementary metal oxide (CMOS) sensors. The apparatus uses at least one reference pixel for each row of pixels in a sensor array. Also, a reset noise elimination unit is provided to adjust the values received from the pixels in a particular row by an adjustment value determined from the reset values received from the reference pixels. Additionally, a method of using the apparatus is disclosed. The method has a step of providing a first reset signal to a row of pixels including the reference pixels. The method also reads out a first set of values from this row after integration. The method continues with providing a second reset signal to the row and a second set of values is read from the row. An adjustment value is calculated from the difference of the values which are read out from the reference pixels.

Stacked Die Integrated Circuit Device

View page

US Patent:

62291580, May 8, 2001

Filed:

Apr 3, 2000

Appl. No.:

9/541781

Inventors:

Ronald K. Minemier - Tempe AZ
Jon M. Dhuse - Chandler AZ

Assignee:

Intel Corporation - Santa Clara CA

International Classification:

H01L 2715
H01L 3112
H01L 3300

US Classification:

257 81

Abstract:

A compound die may be formed of two dies each having face and back sides, said dies being connected with said dies in face to face alignment. A radiation communication system may be used to assist in aligning the dies and in providing communications between the two dies. In this way, a composite structure may be produced which has advanced capabilities, a small footprint, and low impedance.

Method And Apparatus To Reduce Row Reset Noise In Photodiode

View page

US Patent:

61338621, Oct 17, 2000

Filed:

Jul 31, 1998

Appl. No.:

9/127310

Inventors:

Jon M. Dhuse - Chandler AZ
Kevin M. Connolly - Chandler AZ
Mark A. Beiley - Chandler AZ

Assignee:

Intel Corporation - Santa Clara CA

International Classification:

H03M 106

US Classification:

341118

Abstract:

What is disclosed is an apparatus for reducing row reset noise in photodiode based complementary metal oxide (CMOS) sensors. The apparatus uses at least one reference pixel for each row of pixels in a sensor array. Also, a reset noise elimination unit is provided to adjust the values received from the pixels in a particular row by an adjustment value determined from the reset values received from the reference pixels. Additionally, a method of using the apparatus is disclosed. The method has a step of providing a first reset signal to a row of pixels including the reference pixels. The method also reads out a first set of values from this row after integration. The method continues with providing a second reset signal to the row and a second set of values is read from the row. An adjustment value is calculated from the difference of the values which are read out from the reference pixels.

Stacked Die Integrated Circuit Device

View page

US Patent:

60939389, Jul 25, 2000

Filed:

May 25, 1999

Appl. No.:

9/318778

Inventors:

Ronald K. Minemier - Tempe AZ
Jon M. Dhuse - Chandler AZ

Assignee:

Intel Corporation - Santa Clara CA

International Classification:

H01L 3100
H01L 2715

US Classification:

257 80

Abstract:

A compound die may be formed of two dies each having face and back sides, said dies being connected with said dies in face to face alignment. A radiation communication system may be used to assist in aligning the dies and in providing communications between the two dies. In this way, a composite structure may be produced which has advanced capabilities, a small footprint, and low impedance.