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John Teleska Phones & Addresses

  • 38 Parkridge Dr, Pittsford, NY 14534 (585) 264-9294 (585) 264-9497 (585) 264-9656
  • 27 Berkshire St, Rochester, NY 14607 (716) 242-8907 (716) 442-6968 (716) 473-5506
  • Birmingham, AL

Work

Company: The springs integrative medicine center, clifton springs hospital & clinic 2003 Position: Hypnotherapist

Education

Degree: Master of Education, Masters School / High School: University of Rochester 1980 to 1982 Specialities: Education

Skills

Treatment • Stress • Wellness • Healing • Pain Management • Psychotherapy • Family Therapy • Holistic Health • Psychology • Stress Management • Hypnotherapy • Mindfulness

Interests

Biking • Stargazing • X Country Skiing

Industries

Mental Health Care

Resumes

Resumes

John Teleska Photo 1

Hypnotherapist

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Location:
27 Berkshire St, Rochester, NY 14607
Industry:
Mental Health Care
Work:
The Springs Integrative Medicine Center, Clifton Springs Hospital & Clinic
Hypnotherapist

Private Practice
Hypnotherapist
Education:
University of Rochester 1980 - 1982
Master of Education, Masters, Education
University of Rochester 1968 - 1972
Bachelors, Bachelor of Science, Physics
Skills:
Treatment
Stress
Wellness
Healing
Pain Management
Psychotherapy
Family Therapy
Holistic Health
Psychology
Stress Management
Hypnotherapy
Mindfulness
Interests:
Biking
Stargazing
X Country Skiing

Business Records

Name / Title
Company / Classification
Phones & Addresses
John A Teleska
Manager
INTI ELECTRONICS, LLC
360 Red Butte Dr, Sedona, AZ 86351
38 Parkridge Dr, Pittsford, NY 14534
John Teleska
Teleska, John
Hypnotherapy
38 Parkridge Dr, Pittsford, NY 14534
(585) 264-9497

Publications

Us Patents

Automated Optical Surface Profile Measurement System

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US Patent:
61574503, Dec 5, 2000
Filed:
Mar 9, 1998
Appl. No.:
9/037202
Inventors:
Silvio P. Marchese-Ragona - Rochester NY
Robert Bryant - Honeoye Falls NY
Matthew E. Seelig - Rochester NY
Dag Lindquist - Penfield NY
Donald P. McClimans - Fairport NY
Edward J. Merritt - Caledonia NY
John E. Stephan - Rochester NY
John A. Teleska - Rochester NY
Assignee:
Chapman Instruments - Rochester NY
International Classification:
G01B 1124
G01B 1100
G01N 2100
US Classification:
356376
Abstract:
A fully automated surface profiling system having a loading chamber and an adjacent measurement chamber containing a phase differential laser optical scanning system and a five-axis positioner having a vacuum chuck for holding and orienting a wafer for surface profile measurement. The positioner can displace a mounted wafer lengthwise and crosswise of the chamber, can rotate the wafer about vertical and horizontal axes through the positioner, and can rotate the wafer about its own axis. Each motion is motor-driven and can be carried out independently of all the others or in compound motion as needed. The positioner can accommodate a series of replaceable chucks for holding wafers of different diameters. The loading chamber has a cassette dock for receiving a cassette containing wafers to be tested, a robotic server, and a prealigner. All operations within the profilometer are controlled by a programmable CPU at a control station.

Analog To Digital Conversion System Having Automatically And Dynamically Variable Resolution Range

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US Patent:
55681433, Oct 22, 1996
Filed:
Oct 27, 1994
Appl. No.:
8/330399
Inventors:
Robert J. Hutchison - Pittsford NY
John A. Teleska - Rochester NY
Assignee:
Lucid Technologies Inc - Henrietta NY
International Classification:
H03M 118
US Classification:
341139
Abstract:
In order to digitize with sufficient resolution an analog signal, which may be generated by a photodetector in a spectrophotometer, an improved analog to digital conversion system is provided having an integrator stage, an analog to digital converter, a microprocessor and interface circuits for providing communication between the microprocessor and a host computer. The integrator may include an operational amplifier with a capacitor in feedback relationship therewith for providing an output which varies linearly as function of time. The microprocessor operates the analog to digital converter to sample the integrator output at successive increments of time which increase in accordance with a binary relationship to an increment corresponding in binary value to the desired upper end of the resolution range. The digitized samples from the analog to digital converter are compared with a predetermined value in the upper end of the amplitude range of the converter. Low amplitude analog signals do not reach the predetermined level until the later sampling times and thus are resolved at the upper end of the resolution range.
John A Teleska from Pittsford, NY, age ~74 Get Report