Search

Joerg Kaercher

from Madison, WI
Age ~54
Get Report
Connected to:
Carolyn G Kaercher, 58Linda A Kaercher, 66Michael S Kaercher, 63Dillon L Kaesberg, 38Frances L Kaesberg, 71Jeff A Kaesberg, 49Reanne H Kaesberger, 58Daniel J Kaeser, 52Luke E Kaeser, 50Nick Kaeser, 61

Joerg Kaercher Phones & Addresses

  • Madison, WI
  • Fitchburg, WI
  • 2808 Mickelson Pkwy, Madison, WI 53711 (608) 790-6789

Work

Position: Personal Care and Service Occupations

Education

Degree: Bachelor's degree or higher

Emails

j***[email protected]

Resumes

Resumes

Joerg Kaercher Photo 1

Manager, Sc-Xrd Engineering

View page
Location:
Madison, WI
Industry:
Nanotechnology
Work:
Bruker Axs
Manager, Sc-Xrd Engineering
Georg-August-Universität Göttingen May 1995 - Nov 2000
Teaching Assistant
Bruker Axs Nov 1998 - Oct 2000
Software Engineering Consultant
Education:
The University of Göttingen 1990 - 2000
Bachelors, Bachelor of Science, Chemistry
Skills:
Python
Linux
Programming
R&D
Software Engineering
Software Development
Algorithms
Chemistry
Product Development
Science
Analytical Chemistry
Qt
Agile Methodologies
Scrum
Languages:
German
English
Joerg Kaercher Photo 2

Joerg Kaercher

View page
Location:
Madison, Wisconsin Area
Industry:
Biotechnology
Skills:
Python
Linux
R&D
Languages:
German
English

Publications

Us Patents

Multiply-Sampled Cmos Sensor For X-Ray Diffraction Measurements With Corrections For Non-Ideal Sensor Behavior

View page
US Patent:
20130108021, May 2, 2013
Filed:
Oct 31, 2011
Appl. No.:
13/285089
Inventors:
Roger D. DURST - Middleton WI, US
Gregory A. WACHTER - Sun Prairie WI, US
Joerg KAERCHER - Madison WI, US
Assignee:
BRUKER AXS, INC. - Madison WI
International Classification:
G01N 23/20
US Classification:
378 71
Abstract:
Readout noise for each pixel in a CMOS Active Pixel Sensor is reduced by a five step process in which the pixel charge data from the sensor is non-destructively sampled at a plurality of times during a sensor frame time period and corrected for gain variation and nonlinearity. Then fixed pattern and dark current noise is estimated and subtracted from the corrected pixel charge data. Next, reset noise is estimated and subtracted from the pixel charge data. In step four, a model function of charge versus time is fit to the corrected pixel charge data samples. Finally, the fitted model function is evaluated at frame boundary times.

Method For Correcting Timing Skew In X-Ray Data Read Out Of An X-Ray Detector In A Rolling Shutter Mode

View page
US Patent:
20130103339, Apr 25, 2013
Filed:
Oct 24, 2011
Appl. No.:
13/279393
Inventors:
Roger D. DURST - Middleton WI, US
Joerg KAERCHER - Madison WI, US
Gregory A. WACHTER - Sun Prairie WI, US
Assignee:
BRUKER AXS, INC. - Madison WI
International Classification:
G01N 23/207
G06F 19/00
US Classification:
702104
Abstract:
In an X-ray detector operating in a rolling shutter read out mode, by precisely synchronizing sample rotation with the detector readout, the effects of timing skew on the image intensities and angular positions caused by the rolling shutter read out can be compensated by interpolation or calculation, thus allowing the data to be accurately integrated with conventional software. In one embodiment, the reflection intensities are interpolated with respect to time to recreate data that is synchronized to a predetermined time. This interpolated data can then be processed by any conventional integration routine to generate a 3D model of the sample. In another embodiment a 3D integration routine is specially adapted to allow the time-skewed data to be processed directly and generate a 3D model of the sample.

Indirect Photon-Counting Analytical X-Ray Detector

View page
US Patent:
20190056514, Feb 21, 2019
Filed:
Jul 27, 2018
Appl. No.:
16/047731
Inventors:
- Madison WI, US
Joerg KAERCHER - Madison WI, US
Roger D. DURST - Pfinztal, DE
International Classification:
G01T 1/20
G01T 1/36
Abstract:
An indirect, photon-counting X-ray detector capable of detecting the low-energy X-rays includes a scintillator screen that is directly coupled to a two-dimensional optical sensor. A signal filter receives an electrical output signal from the optical sensor and removes high intensity signal contributions therefrom that are indicative of direct interaction between said X-ray signal and said optical sensor. The scintillator screen has a sufficient thickness to ensure a high absorption of incident X-ray photons, and uses phosphor grains with a relatively small grain size. A cooling apparatus in thermal communication with the optical sensor may be used to control its temperature. The signal filter maintains a running average of changes in measured pixel output values for consecutive measurements, and replaces a measured value caused by a direct interaction event with a value equal to a previous measured value plus said running average.

Method Of Conducting An X-Ray Diffraction-Based Crystallography Analysis

View page
US Patent:
20150276629, Oct 1, 2015
Filed:
Jan 28, 2014
Appl. No.:
14/166286
Inventors:
- MADISON WI, US
Joerg KAERCHER - Madison WI, US
Bruce C. NOLL - Madison WI, US
International Classification:
G01N 23/205
G01N 23/20
Abstract:
A method of X-ray diffraction-based analysis for determining the structure of a crystal sample is provided. The method comprises conducting pre-experiment to collect a first set of diffraction images including reflections at corresponding intensities. The method also comprises conducting a main experiment to collect a second set of diffraction images, the diffraction images of the second set including the reflections with higher relative intensities than those produced during the first experiment, at least some of the diffraction images of the second set including topped reflections resulting from detector saturation. The method also includes a step of replacing intensities of the topped reflections from the second set of images with intensities obtained for the corresponding reflections from the first set of images.

X-Ray Diffraction Based Crystal Centering Method Using An Active Pixel Array Sensor In Rolling Shutter Mode

View page
US Patent:
20150103980, Apr 16, 2015
Filed:
Oct 10, 2013
Appl. No.:
14/050853
Inventors:
- Madison WI, US
Joerg KAERCHER - Madison WI, US
International Classification:
G01N 23/207
US Classification:
378205
Abstract:
A method of centering a single crystal sample in the X-ray beam of a diffractometer uses detection of diffraction spots with an active pixel sensor operated in rolling shutter mode. A sample is mounted in the automated goniometer head of the diffractometer and an approximate center of the sample found through which three perpendicular sample axes pass. With a first sample axis perpendicular to a center axis of the X-ray beam, the sample is moved along the first axis from a first position outside of the beam, through the beam and then to a second position outside of the beam. The positions at which first the presence and then the absence of diffraction spots are detected are determined, and the steps repeated for each of the other two perpendicular directions. A precise center may then be found by determining the centroid of the six coordinates thereby obtained.

Method For Correcting Timing Skew In X-Ray Data Read Out Of An X-Ray Detector In A Rolling Shutter Mode

View page
US Patent:
20150046112, Feb 12, 2015
Filed:
Oct 24, 2014
Appl. No.:
14/523484
Inventors:
- Madison WI, US
Joerg KAERCHER - Madison WI, US
Gregory A. WACHTER - Sun Prairie WI, US
International Classification:
G01N 23/207
G01T 1/24
G06F 17/17
G01N 23/20
US Classification:
702 89
Abstract:
In an X-ray detector operating in a rolling shutter read out mode, by precisely synchronizing sample rotation with the detector readout, the effects of timing skew on the image intensities and angular positions caused by the rolling shutter read out can be compensated by interpolation or calculation, thus allowing the data to be accurately integrated with conventional software. In one embodiment, the reflection intensities are interpolated with respect to time to recreate data that is synchronized to a predetermined time. This interpolated data can then be processed by any conventional integration routine to generate a 3D model of the sample. In another embodiment a 3D integration routine is specially adapted to allow the time-skewed data to be processed directly and generate a 3D model of the sample.
Control profile
Joerg Kaercher from Madison, WI, age ~54 Get Report