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Jeremy L Praissman

from Athens, GA
Age ~45
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Related to:
Maria PraissmanKip Praissman, 42Mary PraissmanGary PraissmanAlan Praissman, 58
Connected to:
Manuel Praiz, 33Joshua D Praizner, 36Akash Prajapati, 41Alpa H Prajapati, 44Arpana Prajapati, 41Bharat Prajapat, 36Chaitali J Prajapati, 49Deepesh K Prajapati, 39Geeta U Prajapati, 56Harshal P Prajapati, 33

Jeremy Praissman Phones & Addresses

  • Athens, GA
  • 321 Erik Dr, East Setauket, NY 11733
  • Setauket, NY
  • West Chester, PA
  • Long Beach, NY
  • Alhambra, CA

Work

Company: Laboratory of professor lance wells complex carbohydrate research center Apr 2020 Position: Research manager

Education

Degree: Doctorates, Doctor of Philosophy School / High School: The University of Georgia 2010 to 2015 Specialities: Philosophy

Resumes

Resumes

Jeremy Praissman Photo 1

Research Manager

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Location:
Athens, GA
Work:
Laboratory of Professor Lance Wells Complex Carbohydrate Research Center
Research Manager
Education:
The University of Georgia 2010 - 2015
Doctorates, Doctor of Philosophy, Philosophy

Publications

Us Patents

High-Throughput Methods For Determining Electron Density Distributions And Structures Of Crystals

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US Patent:
20060029184, Feb 9, 2006
Filed:
Aug 26, 2005
Appl. No.:
11/213619
Inventors:
Dawei Lin - Athens GA, US
Zhi-Jie Liu - Athens GA, US
Jeremy Praissman - Athens GA, US
John Rose - Winterville GA, US
Wolfram Tempel - Toronto, CA
Bi-Cheng Wang - Athens GA, US
Assignee:
University of Georgia Research Foundation, Inc. - Athens GA
International Classification:
G01N 23/207
US Classification:
378073000
Abstract:
Disclosed are high-throughput methods for determining crystal structures from X-ray diffraction data, for example high-throughput crystal structure determination methods employing flexible, high-throughput modular computational pipelines, such as Bioperl computational pipelines. High-throughput methods for determining crystal structures can be fully or partially automated, and can be fully or partially computer executed. Crystal structure determination methods employing a pipeline interface, work flow manager and/or output parsers can be used to optimize the amount of structural information derived from an X-ray diffraction data set and increase the efficiency of calculating crystal structures from X-ray diffraction data.

Methods And Systems For Analyzing Ratiometric Data

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US Patent:
20090060266, Mar 5, 2009
Filed:
Aug 28, 2008
Appl. No.:
12/200046
Inventors:
Andrew T. Sornborger - Athens GA, US
James D. Lauderdale - Statham GA, US
Charles H. Keith - Bluffton SC, US
Josef M. Broder - Ithaca NY, US
Jeremy L. Praissman - Athens GA, US
Assignee:
University of Georgia Research Foundation, Inc. - Athens GA
International Classification:
G06K 9/00
G06F 17/15
G06F 7/00
G06F 17/14
US Classification:
382100, 708424, 708203, 708400
Abstract:
Systems and methods for analyzing ratiometric data, e.g., ratiometric image data such as fluorescent image data.
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Jeremy L Praissman from Athens, GA, age ~45 Get Report