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Jengwei Te Pan

from Scotts Valley, CA
Age ~68

Jengwei Pan Phones & Addresses

  • 114 Sherman Dr, Scotts Valley, CA 95066
  • 1532 Chaumont Dr, San Jose, CA 95118 (408) 269-7542
  • 705 Star Jasmine Ct, San Jose, CA 95131 (408) 383-9401
  • 1014 Clark Ave, Mountain View, CA 94040
  • 529 Maybell Ave, Palo Alto, CA 94306
  • Santa Clara, CA
  • 705 Star Jasmine Ct, San Jose, CA 95131 (619) 723-9329

Work

Company: Ambarella corp - Santa Clara, CA Nov 2008 Position: Member of technical staff

Education

School / High School: Arizona State University- Tempe, AZ Sep 1984 Specialities: M.S. in Electrical/Computer Engineering

Resumes

Resumes

Jengwei Pan Photo 1

Jengwei Pan San Jose, CA

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Work:
Ambarella Corp
Santa Clara, CA
Nov 2008 to Mar 2014
Member of Technical Staff

Ambarella Taiwan Ltd

2004 to 2008
Senior Director

Sun Microsystems Inc., / Afara Websystems Inc
Sunnyvale, CA
2001 to 2004
Processor and Network Product

PLX Technology Inc., / Sebring Networks
Sunnyvale, CA
1999 to 2001
CAD/Physical Design Manager

Silicon Graphics Computer Systems
Mountain View, CA
1997 to 1999
Member of Technical Staff

Exponential Technology Inc
San Jose, CA
1995 to 1997
Technical Lead/Member of Technical Staff

Silicon Graphics/MIPS Technology Inc
Mountain View, CA
1994 to 1995
Member of Technical Staff

Digital Equipment Corporation
Hudson, MA
1991 to 1994
Project Leader/Principal Software Engineer

Semiconductor Engineering Group

1987 to 1991
Senior Software Engineer

Semiconductor Engineering Group

1984 to 1987
Software Engineer II

Education:
Arizona State University
Tempe, AZ
Sep 1984
M.S. in Electrical/Computer Engineering

National Cheng Kung University
Jun 1979
B.S. in Electrical Engineering

Publications

Us Patents

Ram-Like Test Structure Superimposed Over Rows Of Macrocells With Added Differential Pass Transistors In A Cpu

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US Patent:
59517026, Sep 14, 1999
Filed:
Apr 4, 1997
Appl. No.:
8/832922
Inventors:
Hank Lim - Mountain View CA
Earl T. Cohen - Fremont CA
Peter J. Vigil - San Jose CA
Jengwei Pan - San Jose CA
James S. Blomgren - San Jose CA
Assignee:
S3 Incorporated - Santa Clara CA
International Classification:
G11C 2900
C11C 700
US Classification:
714718
Abstract:
A test structure is added to a microprocessor. The test structure is a RAM-like array of scan-clock word lines which selects a row of macrocells to be read or written. Perpendicular to the scan-clock word lines and the rows of macrocells are scan-data bit lines. Each testable macrocell has true and complement signal nodes that are connected to a pair of scan-data bit lines through a pair of n-channel pass transistors. The gates of the pass transistors are controlled by the scan-clock word line. The true and complement signal nodes are the cross-coupled inverters or gates in a latch. The latch is written or loaded by driving opposite data values onto the pair of scan-data bit lines when the pass transistors are activated by the scan-clock word line. The macrocells have random widths and thus do not form regular columns, so the columns of scan-data bit lines must be expanded to accommodate the various macrocell widths. Non-storage macrocells such as logic gates and buffers can be read but not written using the pass transistors connected to true and complement nodes in the macrocell.
Jengwei Te Pan from Scotts Valley, CA, age ~68 Get Report