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James E Orsillo

from Bend, OR
Age ~56
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Also known as:
James Eric Orsillo, James O
Phone and address:
869 NW Wall St, Bend, OR 97701
(541) 382-8006
Related to:
Elliott Jacob Orsillo, 46Ryan Howard Orsillo, 47Nicholas OrsilloNicholas J Orsillo, 50Yvette R Orsillo, 57Carlene A Orsillo, 29Jon P Deardorff, 52
Connected to:
Frank J Orsillo, 91John A Orsillo, 88Daniel Orsine, 57Alice T Orsini, 88Annemarie Orsini, 39Arthur P Orsini, 78Brenda C Orsini, 70Chiara F Orsini, 50Claire Orsini, 41Donato C Orsini, 88

James Orsillo Phones & Addresses

  • 869 NW Wall St, Bend, OR 97701 (541) 382-8006
  • 64777 Simon Rd, Bend, OR 97701 (541) 948-1608
  • 5810 SE Oetkin Rd, Portland, OR 97267
  • Lyons, CO
  • Beaverton, OR
  • San Diego, CA
  • PO Box 8506, Bend, OR 97708

Work

Position: Professional/Technical

Education

Degree: High school graduate or higher

Resumes

Resumes

James Orsillo Photo 1

Project Manager

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Location:
San Francisco, CA
Industry:
Semiconductors
Work:
Oceanic Companies
Project Manager
Northern Investments Jan 2003 - Jan 2016
Commercial Real Estate Investor and Business Development
Systematic Jan 2000 - Jan 2004
Prober To Tester Mechanical Design Engineer
Tokyo Seimitsu Jan 1997 - Jan 2000
Mechanical Engineer and Project Manager
Manufacturing Tool Service Jan 1993 - Jan 1997
Mechanical Tool Designer
Skills:
Mechanical Engineering
Manufacturing
Product Design
Product Development
Engineering
Customer Service
Microsoft Office
Computer Aided Design
Machining
Solidworks
Project Management
Electronics
Materials
Matlab
Languages:
English
James Orsillo Photo 2

James Orsillo

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Business Records

Name / Title
Company / Classification
Phones & Addresses
James Orsillo
Owner
Amalia's
Restaurants
16 SW Wall St, Bend, OR 97702
(541) 382-3244
James Orsillo
Manager
Northern Investments LLC
915 NW Wall St, Bend, OR 97701
1984 Bnd Or, Bend, OR 97709
James Orsillo
Owner
Amalias
Eating Place
915 NW Wall St, Bend, OR 97701
16 SW Wall St, Bend, OR 97702
(541) 382-3244
James Orsillo
Principal
Systematic, Inc
Nonclassifiable Establishments
15645 SE 114 Ave, Happy Valley, OR 97015
James E. Orsillo
Manager
Gmo Enterprises LLC
Business Services
64777 Simon Rd, Bend, OR 97701

Publications

Us Patents

Docking System For Connecting A Tester To A Probe Station Using An A-Type Docking Configuration

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US Patent:
6741072, May 25, 2004
Filed:
Sep 7, 2001
Appl. No.:
09/949113
Inventors:
James E. Orsillo - Bend OR, 97701
Assignee:
James E. Orsillo - Bend OR
International Classification:
G01R 3101
US Classification:
3241581
Abstract:
A docking system that allows a Teradyne J750-type tester to be mounted to both a probe station and a handler using uniform docking hardware. Any desired probe stations may be converted into an A-type configuration so that the J750 may be used on both probe stations and handlers. In one aspect, a head stage is designed to mount uniform docking hardware to convert a probe station to an A-type configuration. In another aspect, the uniform docking hardware includes two separate mounting assemblies. One of the mounting assemblies has two kinematic docking units placed thereon. The other of the mounting assemblies has a single kinematic docking unit. The separate mounting assemblies allows ease of assembly to the probe station and is less costly to manufacture.

Method Of Using A Replacement Headplate To Adapt A Probe Station

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US Patent:
6813817, Nov 9, 2004
Filed:
Jul 16, 2002
Appl. No.:
10/198267
Inventors:
James Orsillo - Portland OR, 97268
Assignee:
James Orsillo - Bend OR
International Classification:
B23P 1704
US Classification:
294011, 2940206, 324758
Abstract:
A method of retrofitting a probe station having an original head plate, so that the probe station may be easily configured to mate with a probe card dish and any tester out of a set of testers. First, the original head plate is removed from the probe station and a replacement head plate, including head plate-tooling plate attachment region alignment items, is attached to the probe station. In addition, a set of tooling plates is provided, each having fastening and alignment items adapted to easily mate to the head plate-tooling plate attachment region fastening and alignment items. Also, each tooling plate defines an aperture designed to engage a probe card dish and includes docking equipment adapted to facilitate docking to a tester out of the set of testers. Furthermore, the set of tooling plates includes, for each particular tester out of the set of testers, a tooling plate adapted to facilitate attachment to the particular tester.

Tooling Plate Adapted To Facilitate Rapid And Precise Attachment Into A Probing Station

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US Patent:
6839948, Jan 11, 2005
Filed:
Mar 18, 2002
Appl. No.:
10/101686
Inventors:
James Orsillo - Portland OR, US
International Classification:
B23Q 300
US Classification:
292816, 2940709, 294071, 2952501, 29559, 269287, 269288, 324758
Abstract:
A tooling plate for installation into a probe station and being formed of a rigid plate defining a major aperture having a rim. The plate also defines a set of peripheral apertures fitted with spring loaded, retained screws adapted to facilitate fastening to mating threaded holes. In one embodiment, a set of dowel locator holes defined by the bottom surface and being precisely positioned with respect to the location of the major aperture. Another embodiment includes docking equipment adapted to permit connection to a predetermined tester attached to the top of the rigid plate.

Method Of Producing A Quantity Of Integrated Circuits

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US Patent:
6925699, Aug 9, 2005
Filed:
Mar 25, 2002
Appl. No.:
10/107082
Inventors:
James Orsillo - Portland OR, US
International Classification:
G01R029/00
US Classification:
29593, 294011, 2940206, 324758
Abstract:
A method of producing a quantity of integrated circuits, that includes testing a set of semiconductor wafers that is made up of a first subset and a second subset. This first subset is configured in such a manner that a first tester is more readily adapted to perform the testing but the second subset is configured in such a manner that a second tester is more readily adapted to perform the testing. A first tooling plate and a second tooling plate are provided. The first tooling plate is attached to a probe station. Then the probe station is mated to the first tester to test the first subset of wafers. In turn, the second tooling plate is attached to the probe station. The probe station is then mated to the second tester to test the second subset of wafers. Finally, the first wafer and said second wafer are diced into the quantity of individual integrated circuits.

Apparatus And Method For Use In Testing A Semiconductor Wafer

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US Patent:
7053646, May 30, 2006
Filed:
Oct 27, 2003
Appl. No.:
10/695245
Inventors:
James F. Orsillo - Bend OR, US
International Classification:
G01R 31/26
US Classification:
324765
Abstract:
The present disclosure relates to an apparatus for use with a probe station in the testing of semiconductor wafers. In one embodiment, an apparatus for testing semiconductor devices includes a first plate and a second plate. The first plate is configured to be mounted to and completely removable from the head stage of a probe station. The second plate is configured to be removably coupled to the first plate and has a major aperture for receiving a probe-card assembly. Docking equipment desirably is mounted to a major surface of the second plate to facilitate docking of a tester to the probe station.

Method Of Retrofitting A Probe Station

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US Patent:
7389572, Jun 24, 2008
Filed:
Sep 14, 2001
Appl. No.:
10/432808
Inventors:
James E. Orsillo - Bend OR, US
International Classification:
B23P 17/04
G01R 31/02
US Classification:
294011, 2940209, 324758
Abstract:
A method of retrofitting a probe station having a head plate (), so that the probe station () is adapted to mate with a predetermined probe card dish () and any tester () out of a set of testers. A depression is then machined into the head plate to create a head plate-tooling plate attachment region. Next, fastening and alignment items are provided and installed in this region. Further, a set of tooling plates () are provided, each having fastening and alignment items adapted to mate to the fastening and alignment items on the attachment regions and defining an aperture designed to engage the predetermined probe card dish. The user may then select a desired one of the tooling plates and mate and fasten the selected tooling plate to the head plate-tooling plate attachment region using the alignment and fastening items.

Probe Device Cleaner And Method

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US Patent:
20040020514, Feb 5, 2004
Filed:
May 16, 2003
Appl. No.:
10/439595
Inventors:
James Orsillo - Bend OR, US
International Classification:
B08B001/00
US Classification:
134/006000, 015/021100
Abstract:
Embodiments of an apparatus and method for cleaning the probes of a probe device are disclosed. In an illustrated embodiment, a cleaning apparatus comprises a cleaning member having a cleaning surface and a support member for supporting the cleaning member. An adjustment mechanism is operable to adjust the tilt orientation of the cleaning surface relative to the probe tips to maximize contact between the probe tips and the cleaning surface when the probe tips are rubbed against the cleaning surface to remove debris therefrom. In particular embodiments, the adjustment mechanism comprises one or more adjusting screws and one or more corresponding hold-down screws extending generally co-axially through the adjusting screws.

Method Of Retrofitting A Probe Station

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US Patent:
6408500, Jun 25, 2002
Filed:
Sep 15, 2000
Appl. No.:
09/662735
Inventors:
James Orsillo - Portland OR, 97268
International Classification:
B23P 1704
US Classification:
294011, 2940206, 324758
Abstract:
A method of retrofitting a probe station having a head plate, so that the probe station is adapted to mate with a predetermined probe card dish and any tester out of a set of testers. A depression is then machined into the head plate to create a head plate-tooling plate attachment region. Next, fastening and alignment items are provided and installed in this region. Further, a set of tooling plates are provided, each having fastening and alignment items adapted to mate to the fastening and alignment items on the attachment regions and defining an aperture designed to engage the predetermined probe card dish. The user may then select a desired one of the tooling plates and mate and fasten the selected tooling plate to the head plate-tooling plate attachment region using the alignment and fastening items.
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James E Orsillo from Bend, OR, age ~56 Get Report