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James N Hilfiker

from Roca, NE
Age ~55
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Also known as:
James N Hillfiker
Phone and address:
2277 Meadow Lark Ln, Saltillo, NE 68430
Related to:
Marceline HazenAdam Dale Hassebroek, 41Sandra Osborne, 76Errol HazenGail Hazen
Connected to:
Nathan E Hilfiker, 40William K Hilfiker, 93Ann N Hilfinger, 72Lance J Hilfman, 66Matthew W Hilgaertner, 56Gary L Hilgard, 53Henry R Hilgard, 88Courtney R Hilgart, 37Jennifer A Hilgefort, 56Donald W Hilgemann, 72

James Hilfiker Phones & Addresses

  • 2277 Meadow Lark Ln, Roca, NE 68430
  • 2832 Sedalia Dr, Lincoln, NE 68516 (402) 423-4062
  • 5641 31St St, Lincoln, NE 68516
  • Bloomfield, NE
  • Tempe, AZ
  • 2832 Sedalia Dr, Lincoln, NE 68516

Work

Company: J.a. woollam co., inc. Aug 1995 Position: Applications engineer at j.a woollam co., inc

Education

Degree: Master of Science, Masters School / High School: University of Nebraska - Lincoln Jan 1, 1988 to 1995 Specialities: Electrical Engineering

Skills

Ellipsometry • Thin Films • Characterization • Materials Science • R&D • Optics • Semiconductors • Electrical Engineering • Sputtering • Afm

Industries

Research

Specialities

Buyer's Agent • Listing Agent

Resumes

Resumes

James Hilfiker Photo 1

Applications Engineer At J.a Woollam Co., Inc

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Location:
2277 Meadow Lark Ln, Roca, NE 68430
Industry:
Research
Work:
J.a. Woollam Co., Inc.
Applications Engineer at J.a Woollam Co., Inc
Education:
University of Nebraska - Lincoln Jan 1, 1988 - 1995
Master of Science, Masters, Electrical Engineering Bloomfield High School
University of Nebraska–Lincoln
Skills:
Ellipsometry
Thin Films
Characterization
Materials Science
R&D
Optics
Semiconductors
Electrical Engineering
Sputtering
Afm

Business Records

Name / Title
Company / Classification
Phones & Addresses
James Hilfiker
Research, Research And Development Staff, Research And Development
J. A. Woollam Co., Inc
Mfg Analytical Instruments · Analytical Instruments · Ophthalmic Goods Mfg · Optical Goods-Manufacturers
645 M St, Lincoln, NE 68508
(402) 477-7501, (402) 477-8214

Publications

Us Patents

Sample Analysis Methodology Utilizing Electromagnetic Radiation

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US Patent:
7385697, Jun 10, 2008
Filed:
May 20, 2004
Appl. No.:
10/849740
Inventors:
John A. Woollam - Lincoln NE, US
Corey L. Bungay - Lincoln NE, US
Thomas E. Tiwald - Lincoln NE, US
Martin M. Liphardt - Lincoln NE, US
Ronald A. Synowicki - Lincoln NE, US
Gregory K. Pribil - Lincoln NE, US
Craig M. Herzinger - Lincoln NE, US
Blaine D. Johs - Lincoln NE, US
James N. Hilfiker - Lincoln NE, US
Assignee:
J.A. Woollam Co., Inc. - Lincoln NE
International Classification:
G01J 4/00
US Classification:
356369
Abstract:
Simultaneous use of wavelengths in at least two ranges selected from RADIO, MICRO, FIR, IR, NIR-VIS-NUV, UV, DUV, VUV EUV, XRAY in a regression procedure to evaluate parameters in mathematical dispersion structures to model dielectric functions.

System For Controlling Intensity Of A Beam Of Electromagnetic Radiation And Method For Investigating Materials With Low Specular Reflectance And/Or Are Depolarizing

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US Patent:
7821637, Oct 26, 2010
Filed:
Feb 21, 2008
Appl. No.:
12/070824
Inventors:
Galen L. Pfeiffer - Lincoln NE, US
Martin M. Liphardt - Lincoln NE, US
James N. Hilfiker - Lincoln NE, US
Assignee:
J.A. Woollam Co., Inc. - Lincoln NE
International Classification:
G01J 4/00
US Classification:
356367, 356364, 356369, 356370
Abstract:
Disclosed is a system for controlling focus, angle of incidence and intensity of an electromagnetic beam over a spectrum of wavelengths, and methodology for optimizing investigation of samples which demonstrate low specular reflectance and/or are depolarizing of a polarized beam of electromagnetic radiation, such as solar cells.

Ellipsometric Investigation And Analysis Of Textured Samples

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US Patent:
8059276, Nov 15, 2011
Filed:
Dec 8, 2008
Appl. No.:
12/315898
Inventors:
James N. Hilfiker - Lincoln NE, US
Jianing Sun - Lincoln NE, US
Ping He - Lincoln NE, US
Martin M. Liphardt - Lincoln NE, US
Assignee:
J.A. Woollam Co., Inc - Lincoln NE
International Classification:
G01J 4/00
US Classification:
356369, 356364
Abstract:
System for, and method of ellipsometric investigation of and analysis of samples which have, for instance, a non-random effectively “regular” textured surface, and/or a surface characterized by an irregular array of faceted structures.

Ellipsometric Investigation And Analysis Of Textured Samples

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US Patent:
8570513, Oct 29, 2013
Filed:
Nov 3, 2011
Appl. No.:
13/373037
Inventors:
James N. Hilfiker - Lincoln NE, US
Jianing Sun - Lincoln NE, US
Ping He - Lincoln NE, US
Martin M. Liphardt - Lincoln NE, US
Assignee:
J.A. Woollam Co., Inc. - Lincoln NE
International Classification:
G01J 4/00
US Classification:
356364, 356369
Abstract:
System for, and method of ellipsometric investigation of and analysis of samples which have, for instance, a non-random effectively “regular” textured surface, and/or a surface characterized by an irregular array of faceted structures.

Method For Evaluating Sample System Anisotropic Refractive Indices And Orientations Thereof In Multiple Dimensions

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US Patent:
6441902, Aug 27, 2002
Filed:
Dec 29, 1999
Appl. No.:
09/474318
Inventors:
James N. Hilfiker - Lincoln NE
Corey L. Bungay - Lincoln NE
Craig M. Herzinger - Lincoln NE
Assignee:
J. A. Woollam Co. Inc. - Lincoln NE
International Classification:
G01J 400
US Classification:
356369, 250225
Abstract:
Disclosed is a method of evaluating sample system anisotropic refractive indices, and orientations thereof with respect to an alignment surface, in multiple dimensions. The preferred method involves a sequence of steps which allows overcoming mathematical model parameter correlation during mathematical regression parameter evaluation, even though individually, steps of the present invention method wherein anisotropic refractive indices, or differences therebetween, are evaluated, require that only a relatively simple one dimensional data set be acquired.
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James N Hilfiker from Roca, NE, age ~55 Get Report