Inventors:
Peter J. Todd - Oak Ridge TN
Henry S. McKown - Oak Ridge TN
David H. Smith - Oak Ridge TN
Assignee:
The United States of America as represented by the United States
Department of Energy - Washington DC
International Classification:
B01D 5944
Abstract:
The invention is directed to a method for increasing the precision of positive-ion relative abundance measurements conducted in a sector mass spectrometer having an ion source for directing a beam of positive ions onto a collimating slit. The method comprises incorporating in the source an electrostatic lens assembly for providing a positive-ion beam of circular cross section for collimation by the slit.