Inventors:
Dirk Walvis - Santa Cruz CA, US
Stephen James Bennett - San Francisco CA, US
Vakis Papaparaskeva - Sunnyvale CA, US
Christian Volf Olgaard - Sunnyvale CA, US
Roman Schilter - Sunnyvale CA, US
Assignee:
LitePoint Corporation - Sunnyvale CA
International Classification:
H04K 1/10
Abstract:
Apparatus and method for testing signals from two or more OFDM transmitters simultaneously with a single VSA.