US Patent:
20120176130, Jul 12, 2012
Inventors:
Micah P. Ledbetter - Oakland CA, US
Charles W. Crawford - Albuquerque NM, US
David E. Wemmer - Berkeley CA, US
Alexander Pines - Berkeley CA, US
Svenja Knappe - Boulder CO, US
John Kitching - Boulder CO, US
Dmitry Budker - El Cerrito CA, US
Assignee:
The Regents of the University of California - Oakland CA
International Classification:
G01R 33/12
Abstract:
An embodiment of a method of detecting a J-coupling includes providing a polarized analyte adjacent to a vapor cell of an atomic magnetometer; and measuring one or more J-coupling parameters using the atomic magnetometer. According to an embodiment, measuring the one or more J-coupling parameters includes detecting a magnetic field created by the polarized analyte as the magnetic field evolves under a J-coupling interaction.
