US Patent:
20170089694, Mar 30, 2017
Inventors:
- Schenectady NY, US
Daniel Scott Groninger - Port Royal PA, US
International Classification:
G01B 21/00
G01N 27/90
G01N 29/22
Abstract:
An inspection system, in an embodiment, can be operable with a probe and a position tracker to inspect an object. The system can be operable to display at least one probe travel axis, receive first and second inspection values from the probe, associate the first inspection value with a first position point, and associate the second inspection value with a second position point. The system displays an inspection path based on the associations. The inspection path extends relative to the probe travel axis.