Resumes
Resumes
Cyrus Earl Phones & Addresses
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731 Rim Rock Rd, Kerrville, TX 78028 (210) 379-3467
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3202 Kerbey Ln, Austin, TX 78703 (512) 445-5457
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150 Humphrey Ave #5, San Antonio, TX 78209 (512) 445-5457
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150 Humphrey Ave, San Antonio, TX 78209
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105 Blue Star #3, San Antonio, TX 78204
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Guerneville, CA
Publications
Us Patents
Apparatus For Holding A Testing Substrate In A Semiconductor Wafer Tester And Method For Using The Same
View pageUS Patent:
57291497, Mar 17, 1998
Filed:
Sep 29, 1995
Appl. No.:
8/536825
Inventors:
Richard S. Bradshaw - Austin TX
Kenneth E. Adams - Austin TX
Cyrus M. Earl - Austin TX
Curtis H. Youngblood - Georgetown TX
Kenneth E. Adams - Austin TX
Cyrus M. Earl - Austin TX
Curtis H. Youngblood - Georgetown TX
Assignee:
Motorola, Inc. - Schaumburg IL
International Classification:
G01R 3102
US Classification:
324758
Abstract:
An apparatus(19) for holding a testing substrate in a wafer prober (16) has a plate (34) hinged to a head stage (18) of the equipment. The plate has two concentric openings to form a ledge (35) for holding the testing substrate (10). Additionally, the ledge has two asymmetrically placed locating pins (38) to allow automatic alignment of the testing substrate which has corresponding alignment holes. A latch (36) locks the plate against the head stage to securely fix the testing substrate in place so that it can make and maintain contact with a pogo pin area (26) on the head stage. The tester also has a wafer support chuck (20) upon which a semiconductor wafer (22) is placed with its active surface up. The head stage of the tester is closed so that the testing substrate contacts the active surface of the semiconductor wafer, and electrical testing may then be performed on the semiconductor wafer.