Resumes
Resumes
Craig Nolen Phones & Addresses
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Emeryville, CA
s
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154 W 5Th St #222, Tempe, AZ 85281
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425 W Rio Salado Pkwy UNIT 310, Tempe, AZ 85281
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Gilbert, AZ
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13134 Old West Ave W, San Diego, CA 92129 (858) 484-6901
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Mesa, AZ
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Chandler, AZ
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Stockton, CA
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Riverside, CA
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13134 Old West Ave, San Diego, CA 92129
Education
Degree:
High school graduate or higher
Publications
Us Patents
Systems And Methods For Material Layer Identification Through Image Processing
View pageUS Patent:
20110299720, Dec 8, 2011
Filed:
Mar 18, 2011
Appl. No.:
13/052009
Inventors:
Craig Merten Nolen - San Diego CA, US
Giovanni Laviste Denina - Moreno Valley CA, US
Desalegne B. Teweldebrhan - Highland CA, US
Alexander A. Balandin - Riverside CA, US
Bir Bhanu - Riverside CA, US
Giovanni Laviste Denina - Moreno Valley CA, US
Desalegne B. Teweldebrhan - Highland CA, US
Alexander A. Balandin - Riverside CA, US
Bir Bhanu - Riverside CA, US
Assignee:
The Regents of the University of California - Oakland CA
International Classification:
G06K 9/00
US Classification:
382100
Abstract:
A fast and fully automated approach for determining the number of atomic planes in layered material samples is provided. Examples of such materials may include graphene and bismuth telluride (BiTe), and materials from the bismuth selenide (BiSe) samples is provided. The disclosed procedure allows for in situ identification of the borders of the regions with the same number of atomic planes. The procedure is based on an image processing algorithm that employs micro-Raman calibration, light background subtraction, correction for lighting non-uniformity, and color and grayscale image processing on each pixel of a graphene image. The developed procedure may further provide a pseudo-color map that marks the single-layer and few-layer regions of the sample. Beneficially, embodiments of the developed procedure may be employed using various substrates and can be applied to materials that are mechanically exfoliated, chemically derived, or deposited on an industrial scale.