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Christian M Kuwasaki

from Sammamish, WA
Age ~51
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Also known as:
Christian Kumasaki, Michael Kuwasaki Christian, Kuwasaki Christian
Phone and address:
1818 226Th Pl NE, Redmond, WA 98074
Related to:
John A Cassell, 78Reid Cassell, 47Rand Cassell, 58Mark BatesMark A Bateskahai, 33Sommer Tyau, 47
Connected to:
Takahiro Kuwayama, 35Dawn M Kuwik, 61Donald R Kuxhausen, 97James A Kuxhaus, 62Kurt R Kuxhausen, 67Ben Kuxhouse, 96Davira Kuy, 37Many R Kuy, 38William Kuyat, 77Charles C Kuyava, 79

Christian Kuwasaki Phones & Addresses

  • 1818 226Th Pl NE, Sammamish, WA 98074
  • 1818 226Th Ave, Sammamish, WA 98074 (425) 450-7031 (425) 836-9836
  • Redmond, WA
  • 321 Orchard Ave, North Bend, WA 98045 (425) 888-6998
  • McMinnville, OR
  • Palo Alto, CA
  • Kent, WA
  • Kiona, WA
  • Mililani, HI

Work

Company: Rudolph technologies - Snoqualmie, WA Mar 2007 Position: Product development manager

Education

School / High School: STANFORD UNIVERSITY- Palo Alto, CA Sep 1991 Specialities: Bachelors of Science in Engineering

Skills

Product Development • Design For Manufacturing • Cross Functional Team Leadership • Engineering Management • Program Management • Product Design • Engineering • Manufacturing • Project Management • Semiconductors • Six Sigma • Electronics • Management • Semiconductor Industry • Industrial Design • Start Ups • Software Project Management • Leadership • Microsoft Office • Microsoft Excel • Senior Program Management • Mechanical Engineering • Business Process Improvement

Industries

Medical Devices

Resumes

Resumes

Christian Kuwasaki Photo 1

Senior R And D Project Leader

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Location:
Sammamish, WA
Industry:
Medical Devices
Work:
Dell Emc Jul 2013 - Oct 2018
Senior Advisor - Global Program Engineering
Philips Jul 2013 - Oct 2018
Senior R and D Project Leader
Rudolph Technologies Mar 2007 - Dec 2012
Product Development Manager
Sci Global Manufacturing Mar 2006 - Oct 2006
Technical Sales Engineer
Kenworth Truck Co. Nov 2004 - Mar 2006
Project Engineer
Education:
Stanford University 2004 - 2009
Bachelors, Bachelor of Science Stanford University 1991 - 1995
Bachelors, Bachelor of Science Saint Louis School 1987 - 1991
Skills:
Product Development
Design For Manufacturing
Cross Functional Team Leadership
Engineering Management
Program Management
Product Design
Engineering
Manufacturing
Project Management
Semiconductors
Six Sigma
Electronics
Management
Semiconductor Industry
Industrial Design
Start Ups
Software Project Management
Leadership
Microsoft Office
Microsoft Excel
Senior Program Management
Mechanical Engineering
Business Process Improvement
Christian Kuwasaki Photo 2

Christian Kuwasaki Sammamish, WA

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Work:
RUDOLPH TECHNOLOGIES
Snoqualmie, WA
Mar 2007 to Dec 2012
Product Development Manager
SCI GLOBAL MANUFACTURING
Everett, WA
Mar 2006 to Oct 2006
Technical Sales Engineer
PACCAR
Kirkland, WA
Nov 2004 to Mar 2006
Project Engineer - Chassis and Powertrain
APPLIED PRECISION
Issaquah, WA
Nov 2003 to Nov 2004
Senior Project Manager - Custom Interfaces
BELSHAW BROTHERS
Seattle, WA
Nov 2002 to Nov 2003
Lead Mechanical Engineer
FIORI PRODUCT DEVELOPMENT
Bothell, WA
Oct 2000 to Nov 2002
Engineering Manager / Product Design Manager
APPLIED PRECISION, Mercer Island
Issaquah, WA
Oct 1995 to Oct 2000
Mechanical Engineer / Fixturing Manager
Education:
STANFORD UNIVERSITY
Palo Alto, CA
Sep 1991 to Jun 1995
Bachelors of Science in Engineering
SAINT LOUIS SCHOOL
Honolulu, HI
Sep 1987 to Jun 1991
High School Diploma

Publications

Us Patents

Probe Card Analysis System And Method

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US Patent:
20110089965, Apr 21, 2011
Filed:
Aug 24, 2010
Appl. No.:
12/862375
Inventors:
Eric Endres - Issaquah WA, US
John T. Strom - North Bend WA, US
Christian Kuwasaki - Sammamish WA, US
Christopher McLaughlin - Minneapolis MN, US
Assignee:
Rudolph Technologies, Inc. - Flanders NJ
International Classification:
G01R 1/067
US Classification:
32475501
Abstract:
A system and method for evaluating wafer test probe cards under real-world wafer test cell condition integrates wafer test cell components into the probe card inspection and analysis process. Disclosed embodiments may utilize existing and/or modified wafer test cell components such as, a head plate, a test head, a signal delivery system, and a manipulator to emulate wafer test cell dynamics during the probe card inspection and analysis process.

Probe Card Analysis System And Method

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US Patent:
20140021970, Jan 23, 2014
Filed:
Jun 18, 2013
Appl. No.:
13/921057
Inventors:
John T. Strom - North Bend WA, US
Christian Kuwasaki - Sammamish WA, US
Christopher McLaughlin - Minneapolis MN, US
International Classification:
G01R 35/00
US Classification:
32475002
Abstract:
A system and method for evaluating wafer test probe cards under real-world wafer test cell condition integrates wafer test cell components into the probe card inspection and analysis process. Disclosed embodiments may utilize existing and/or modified wafer test cell components such as, a head plate, a test head, a signal delivery system, and a manipulator to emulate wafer test cell dynamics during the probe card inspection and analysis process.
Control profile
Christian M Kuwasaki from Sammamish, WA, age ~51 Get Report