Inventors:
Stephen L. Dark - Austin TX, US
Christopher J. Behnke - Austin TX, US
Assignee:
National Instruments Corporation - Austin TX
International Classification:
H04B 3/46
H04B 17/00
H04Q 1/20
US Classification:
375224, 375345, 4552451, 4552501
Abstract:
Systems and methods for measuring transmitter and/or receiver I/Q impairments are disclosed, including iterative methods for measuring transmitter I/Q impairments using shared local oscillators, iterative methods for measuring transmitter I/Q impairments using intentionally-offset local oscillators, and methods for measuring receiver I/Q impairments. Also disclosed are methods for computing I/Q impairments from a sampled complex signal, methods for computing DC properties of a signal path between the transmitter and receiver, and methods for transforming I/Q impairments through a linear system.