US Patent:
20090069866, Mar 12, 2009
Inventors:
John Michael Farbarik - Castro Valley CA, US
John C. Potosky - San Jose CA, US
Anant V. Hegde - Hayward CA, US
Casidy Domingo - San Mateo CA, US
Charisse M. Yung - Los Altos Hills CA, US
Nikhil D. Bhat - Fremont CA, US
George Yoseung Choi - Redwood City CA, US
Assignee:
Pavad Medical, Inc. - Fremont CA
International Classification:
A61N 1/08
Abstract:
An implant testing device and a method of detecting an airway implant are disclosed. The testing device detects the presence of the implant within a patient's body and can be used to determine its location. The testing device also provides an indication of proper function of the implant electronics. A detector circuit of the testing device generates an output signal representative of proximity of the airway implant. A processing circuit receives the output signal and determines proximity of the implant based on one or more detection thresholds. The processing circuit also provides a visual and/or audible alert. In some embodiments, the processing circuit varies the flash rate of one or more light emitting diodes and/or the pitch of an alert tone based on proximity of the implant. Various embodiments of the testing device are adapted for handheld use and can include a handle, elongated portion, and detector element.