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Amy E Dessert

from Eugene, OR
Age ~59
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Also known as:
Amy M Dessert, Amy E Miller, Amye Miller
Phone and address:
1560 Crest Dr, Eugene, OR 97405
(214) 287-2252
Related to:
Susan C Cyr, 61Jack Nicholas DessertJoan M Dessert, 88David A Dessert, 61Steve R Dessert, 60Christopher Rober Dessert, 29Robert A Dessert, 88
Connected to:
Emily S Dessert, 41Michele L Dessert, 61Molly Dessert, 67Richard J Dessert, 62Thierry P Dessertenne, 60Alex J Dessi, 73Daniel Dessi, 34Melinda E Dessicino, 37Carolyn J Dessimoz, 77Michael E Dessimoz, 83

Amy Dessert Phones & Addresses

  • 1560 Crest Dr, Eugene, OR 97405 (214) 287-2252
  • 4345 Jeker Dr, Plano, TX 75074 (972) 424-5581
  • 26 Santa Monica Cir, Wylie, TX 75098 (972) 442-0367 (972) 424-5581
  • Allen, TX
  • Dallas, TX
  • 26 Santa Monica Cir, Wylie, TX 75098 (972) 442-0367

Work

Company: Plano isd 2008 Position: Outdoor educator

Education

School / High School: Southwestern University 1982 to 1985 Specialities: Mathematics, Computer Science

Skills

Integration • Linux • C • Testing • Access • C++ • Visual Basic • Sdlc • Analysis

Emails

d***[email protected]

Industries

Computer Software

Resumes

Resumes

Amy Dessert Photo 1

Outdoor Educator

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Location:
1560 Crest Dr, Eugene, OR 97405
Industry:
Computer Software
Work:
Plano Isd
Outdoor Educator
Texas Instruments 1986 - 2007
Software Engineer
Education:
Southwestern University 1982 - 1985
Skills:
Integration
Linux
C
Testing
Access
C++
Visual Basic
Sdlc
Analysis

Publications

Us Patents

Scheduling Diagnostic Testing Of Automated Equipment For Testing Integrated Circuit Devices

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US Patent:
60615079, May 9, 2000
Filed:
Dec 11, 1997
Appl. No.:
8/988580
Inventors:
Glenn R. Fitzgerald - Garland TX
Lowell Boggs - Lewisville TX
Amy Dessert - Plano TX
Michael Allen Walsh - Plano TX
Eric Gregory Moore - Richardson TX
Stephanie Luhring Smith - Plano TX
Don L. Simpson - Pottsboro TX
Assignee:
Texas Instruments Incorporated - Dallas TX
International Classification:
G01R 3102
US Classification:
39550003
Abstract:
A method of using a processor-based integrated circuit (IC) tester (12) to automatically invoke diagnostic testing. A diagnostic schedule (30) is user-defined (FIG. 3), and checked by the tester (12) at various times, such as before and after the tester 12 tests an IC lot (FIGS. 6, 7, 8). The schedule (30) has various scheduling parameters that permit diagnostic testing to be scheduled to occur at certain times, at the expiration of intervals, or upon certain events. The schedule (30) also permits different levels of diagnostic testing, each level with its own schedule. The tester (12) is programmed to run an appropriate level of diagnostic testing if more than one level is due to occur.
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Amy E Dessert from Eugene, OR, age ~59 Get Report