Inventors:
Jon A. Bickel - Murfreesboro TN, US
Ronald W. Carter - Murfreesboro TN, US
Amjad Hasan - Murfreesboro TN, US
Assignee:
Schneider Electric USA, Inc. - Palatine IL
International Classification:
G06N 5/00
Abstract:
A method of automatically learning how multiple devices are directly or indirectly linked in a monitoring system, comprises determining configuration parameters for the multiple devices in said system, receiving data measured by the devices, and grouping the devices into multiple segments according to at least one type of information selected from the group consisting of configuration parameters and data measured by said devices. Potential relationships of the devices in each segment are determined according to at least one type of information selected from the group consisting of configuration parameters and data measured by the devices, the hierarchies of the devices within individual segments are determined, and the hierarchies of the top-most device or devices in the segments are determined.