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Adrian Patrascu Phones & Addresses

  • 16008 Double Eagle Dr, Austin, TX 78717 (512) 779-7362
  • 2200 Pleasant Valley Rd, Austin, TX 78741 (512) 493-7350
  • 13339 Kinder Pass, Austin, TX 78727 (512) 246-7014
  • 2015 Cedar Bend Cv, Austin, TX 78758 (512) 836-3291
  • 7117 Wood Hollow Dr, Austin, TX 78731
  • 2126 Tree Ln, Kingwood, TX 77339 (281) 359-8761
  • Humble, TX
  • Lovettsville, VA

Work

Company: Ibm Oct 1999 Position: Test tool development engineer

Education

School / High School: The University of Texas at Austin 1995 to 1999

Skills

Computer Architecture • Perl • Debugging • Software Development • Operating Systems • Computer Hardware • C • Linux • Microprocessors • Shell Scripting • Hardware • C++ • Unix • Device Drivers • Embedded Systems • Distributed Systems • Hardware Architecture • Vhdl • Programming • Functional Verification • System Architecture • Eclipse • Soc • Arm • Cache Coherency • Powerpc • Arm Architecture • Arm Assembly • Python

Industries

Wireless

Resumes

Resumes

Adrian Patrascu Photo 1

Verification And Validation Engineer

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Location:
Austin, TX
Industry:
Wireless
Work:
IBM since Oct 1999
Test Tool Development Engineer
Education:
The University of Texas at Austin 1995 - 1999
Skills:
Computer Architecture
Perl
Debugging
Software Development
Operating Systems
Computer Hardware
C
Linux
Microprocessors
Shell Scripting
Hardware
C++
Unix
Device Drivers
Embedded Systems
Distributed Systems
Hardware Architecture
Vhdl
Programming
Functional Verification
System Architecture
Eclipse
Soc
Arm
Cache Coherency
Powerpc
Arm Architecture
Arm Assembly
Python

Publications

Us Patents

Programmable Active Thermal Control

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US Patent:
20120272100, Oct 25, 2012
Filed:
Apr 21, 2011
Appl. No.:
13/091879
Inventors:
Harold Chase - Cedar Park TX, US
Dennis R. Conti - Essex Junction VT, US
James M. Crafts - Warren VT, US
David L. Gardell - Fairfax VT, US
Andrew T. Holle - Austin TX, US
Adrian Patrascu - Austin TX, US
Jody J. Van Horn - Underhill VT, US
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION - Armonk NY
International Classification:
G06F 11/07
US Classification:
714 34, 714E11029
Abstract:
Test equipment provides interrupt capability to automatic testing as a means of actively controlling temperature of the device under test. A processor coupled to memory is responsive to computer-executable instructions contained in the memory. A test socket is coupled to a device under test and coupled to the processor. The processor is configured to interrupt an application pattern running on the device under test. In response to interrupting the application pattern, the processor is configured to cause a control pattern to run on the device under test and then cause the application pattern to restart running from the point of interruption on the device under test.
Adrian A Patrascu from Austin, TX, age ~47 Get Report