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Michael S Mauck

from Portland, OR
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Related to:
Lael Mauck, 25Ashley Galvin, 48Deborah TurnerDebbie TurnerDebra Turner, 72Heather J Mauck, 52
Connected to:
Amanda Mauck, 42Arthur L Mauck, 63Bobette Mauck, 66Brenda M Mauck, 59Chelsea J Mauck, 41Howard W Mauck, 40Melanie A Mauck, 70Melody J Mauck, 48Phyllis D Mauck, 71Ronnie E Mauck, 68

Michael Mauck Phones & Addresses

  • Portland, OR
  • 10460 SW 55Th Ave, Portland, OR 97219 (503) 324-4043

Work

Position: Production Occupations

Education

Degree: Bachelor's degree or higher

Professional Records

Medicine Doctors

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Michael G. Mauck

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Specialties:
Oral & Maxillofacial Surgery
Work:
Oral Facial & Cosmetic Surgery Center
4765 S Congress Ave STE A, Lake Worth, FL 33461
(561) 439-6600 (phone), (561) 439-7660 (fax)
Conditions:
Gingival and Periodontal Diseases
Tempromandibular Joint Disorders (TMJ)
Languages:
English
Description:
Dr. Mauck works in Lake Worth, FL and specializes in Oral & Maxillofacial Surgery. Dr. Mauck is affiliated with Palms West Hospital.

Resumes

Resumes

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Director Of Research And Development

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Location:
Portland, OR
Industry:
Research
Work:
Cascade Coil Drapery 1992 - 2011
Director of R and D
Coincident Beams Licensing 1992 - 2011
Director of Research and Development
Education:
Benson Polytechnic
Portland State University
Doctorates, Doctor of Philosophy, Physics
Skills:
R&D
Nanotechnology
Science
Research
Materials Science
Design For Manufacturing
Matlab
Product Development
Spectroscopy
Algorithms
Software Development
Simulations
Teaching
Coaching
Characterization
Thin Films
Biomedical Engineering
Embedded Systems
Training
Optics
Public Speaking
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Benson

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Work:
United States
Benson
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Vice President Retail Operations

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Michael Mauck Photo 5

Michael Mauck

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Business Records

Name / Title
Company / Classification
Phones & Addresses
Michael Mauck
Owner
Mauck Systems
Electron Optics Consultant
10460 SW 55 Ave, Portland, OR 97219
(503) 244-4043

Publications

Us Patents

Method And Apparatus For Simultaneously Depositing And Observing Materials On A Target

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US Patent:
6522056, Feb 18, 2003
Filed:
Jun 30, 2000
Appl. No.:
09/608908
Inventors:
Michael Mauck - Portland OR
Assignee:
Coincident Beams Licensing Corporation - Portland OR
International Classification:
H05H 706
US Classification:
3133591, 3133611, 250396 R, 250298, 315500, 315507, 31511161
Abstract:
A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.

Method And Apparatus For Simultaneously Depositing And Observing Materials On A Target

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US Patent:
6611087, Aug 26, 2003
Filed:
Aug 6, 2002
Appl. No.:
10/213828
Inventors:
Michael Mauck - Portland OR
Assignee:
Coincident Beams Licensing Corporation - Portland OR
International Classification:
H05H 706
US Classification:
3133591, 3133611, 250396 R, 250298, 315500, 315507, 31511161
Abstract:
A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.

Method And Apparatus For Simultaneously Depositing And Observing Materials On A Target

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US Patent:
6815880, Nov 9, 2004
Filed:
May 2, 2003
Appl. No.:
10/429067
Inventors:
Michael Mauck - Portland OR
Assignee:
Coincident Beams Licensing Corporation - Portland OR
International Classification:
H05H 706
US Classification:
3133591, 3133611, 315500, 315507, 31511161, 250396 R, 250298
Abstract:
A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.

Method And Apparatus For Simultaneously Depositing And Observing Materials On A Target

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US Patent:
6906453, Jun 14, 2005
Filed:
May 10, 2004
Appl. No.:
10/842899
Inventors:
Michael Mauck - Portland OR, US
Assignee:
Coincident Beams Licensing Corporation - Portland OR
International Classification:
H05H007/06
US Classification:
3133591, 3133611, 250396 R, 250298, 315500, 315507, 31511161
Abstract:
A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.

Method And Apparatus For Simultaneously Depositing And Observing Materials On A Target

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US Patent:
7078852, Jul 18, 2006
Filed:
Mar 17, 2005
Appl. No.:
11/084409
Inventors:
Michael Mauck - Portland OR, US
Assignee:
Coincident Beams Licensing Corporation - Portland OR
International Classification:
H05H 7/06
US Classification:
3133591, 3133611, 250396 R, 250298, 315500, 315507, 31511161
Abstract:
A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.

Non-Destructive Testing System Using A Laser Beam

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US Patent:
7206078, Apr 17, 2007
Filed:
Nov 20, 2002
Appl. No.:
10/301030
Inventors:
Paul Pfaff - Portland OR, US
Michael Mauck - Portland OR, US
Assignee:
Attofemto, Inc. - Lake Oswego OR
International Classification:
G01N 21/24
G01N 21/43
US Classification:
356517
Abstract:
A noninvasive testing system using a method of testing a device under test by providing a beam of light from a light source having a first wavelength, and in a first beam instance imposing the beam of light on a test device when the test device has a first state of refractive indexes, and in a second beam instance imposing the beam of light on the test device when the test device has a second state of refractive indexes, in both instances the beam of light being imposed on the test device over a spatial region within the test device substantially greater than the first wavelength. Data resulting from the interference of the first beam instance and the second beam instance within the device under test is obtained representative of the voltages within the region. The first state of refractive indexes is at a first voltage potential, and the second state of refractive indexes is at a second voltage potential different from the first voltage potential.

Method And Apparatus For Simultaneously Depositing And Observing Materials On A Target

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US Patent:
7381949, Jun 3, 2008
Filed:
Jun 15, 2006
Appl. No.:
11/454967
Inventors:
Michael Mauck - Portland OR, US
Assignee:
Coincident Bearns Licensing Corporation - Portland OR
International Classification:
B01D 59/44
US Classification:
250298, 250396 R, 2504911, 3133591, 3133611, 315500, 315507, 31511161
Abstract:
A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.

Method And Apparatus For Simultaneously Depositing And Observing Materials On A Target

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US Patent:
20080258073, Oct 23, 2008
Filed:
May 27, 2008
Appl. No.:
12/154956
Inventors:
Michael Mauck - Portland OR, US
International Classification:
H01J 3/26
US Classification:
250396ML
Abstract:
A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.
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Michael S Mauck from Portland, OR Get Report