Professional Records
License Records
Larry Denneau
Address:
2471 Pacific Hts Rd, Honolulu, HI 96813
License #:
A5270406
Category:
Airmen
Larry Denneau Phones & Addresses
-
3056 Treeline Dr, Tucson, AZ 85741 (520) 297-1676
-
Honolulu, HI
Business Records
Name / Title
Company / Classification
Phones & Addresses
Principal
Honolulu Housing Hui LLC
Business Services at Non-Commercial Site
Business Services at Non-Commercial Site
2127 Metcalf St, Honolulu, HI 96822
Publications
Us Patents
Method And Apparatus For Restoring Digitized Video Pictures Generated By An Optical Surface-Height Profiler
View pageUS Patent:
57177821, Feb 10, 1998
Filed:
Nov 14, 1994
Appl. No.:
8/339405
Inventors:
Larry Denneau - Tucson AZ
Assignee:
Wyko Corporation - Tucson AZ
International Classification:
G06K 900
G06K 936
G06K 954
G06K 936
G06K 954
US Classification:
382154
Abstract:
A method for correcting a height map produced by an optical height profiler while scanning a target surface. Regions of bad data are identified and erroneous height values are replaced with provisional height values based selected from neighboring valid height values. Each provisional height value is also assigned a position index corresponding to its proximity to the boundary of the region. Starting from the interior of the region, the technique then replaces each provisional height value with a corrected height value calculated by interpolation of valid height values as a function of distance from the boundary as represented by the position indices. The resulting corrected height map is suitable for on-line visual display.
Calibration And Error Correction In Multi-Channel Imaging
View pageUS Patent:
20050083531, Apr 21, 2005
Filed:
Oct 16, 2003
Appl. No.:
10/687308
Inventors:
James Millerd - Aliso Viejo CA, US
Neal Brock - Tucson AZ, US
Larry Denneau - Tucson AZ, US
Neal Brock - Tucson AZ, US
Larry Denneau - Tucson AZ, US
International Classification:
G01B009/02
US Classification:
356450000
Abstract:
A multi-channel imaging system is calibrated by measuring the geometric distortion in each sub-image, generating corresponding correction factors, and applying such factors to correct subsequent image data. In addition, intensity transfer-function arrays are measured at each pixel, and further used to correct for system and detector nonlinearities and nonuniformity between images. The procedure is repeated over a range of wavelengths to produce a complete set of correction coefficients and transfer functions. When the system is used for interferometric phase measurements, multiple measurements are preferably taken and a random phase offset in the reference path length is introduced at each measurement. The multiple phase data so derived are then averaged to reduce phase-dependent systematic measurement errors.