Kenneth Alan Newton

8624181, Jan 7, 2014

Mar 15, 2013

13/840898

Kenneth Newton - Loveland CO, US

Agilent Technologies, Inc. - Santa Clara CA

H01J 49/40
H01J 49/26
B01D 59/44

250287, 250288, 250281, 250282, 250423 R, 250424

A time-of-flight mass spectrometer (TOF MS) includes an ion gate, an ion guide downstream of the ion gate, and a TOF analyzer downstream of the ion guide. The TOF MS is operated with an adjustable duty cycle to limit the amount of ions entering a TOF analyzer and avoid saturating a detector system of the TOF MS. The duty cycle is adjusted by controlling the ion gate. The ion guide emits ions as a continuous beam, without trapping the ions. The ion guide may be operated as a collision cell. The TOF MS may also include a mass filter upstream of the ion guide.

8637816, Jan 28, 2014

Mar 14, 2013

13/827685

Kenneth R. Newton - Loveland CO, US

Agilent Technologies, Inc. - Santa Clara CA

H01J 3/00
H01J 49/42
H01J 49/26
B01D 59/44

250292, 250290, 250282, 250281, 250286

A mass spectrum is acquired by accumulating parent ions in an ion trap, ejecting parent ions of a selected m/z ratio into a collision cell, producing fragment ions from the parent ions, and analyzing the fragment ions in a mass analyzer. The other parent ions remain stored in the ion trap, and thus the process may be repeated by mass-selectively scanning parent ions from the ion trap. In this manner, the full mass range of parent ions or any desired subset of the full mass range may be analyzed without significant ion loss or undue time expenditure. The collision cell may provide a large ion acceptance aperture and relatively smaller ion emission aperture. The collision cell may pulse ions out to the mass analyzer. The mass analyzer may be a time-of-flight analyzer. The timing of pulsing of ions out from the collision cell may be matched with the timing of pulsing of ions into the time-of-flight analyzer.

20140034825, Feb 6, 2014

Mar 15, 2013

13/833785

Agilent Technologies, Inc. - , US
Kenneth Newton - Loveland CO, US

Agilent Technologies, Inc. - Loveland CO

H01J 49/02

250282, 250489

An ion trap includes a trap exit at which an ion energy adjusting device is located. The adjusting device may be configured for focusing a beam of ions ejected from the trap, reducing the energy distribution of the ions, and/or reducing the average kinetic energy of the ions. The adjusting device may include lenses to which RF and/or DC voltages are applied.